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A measuring method of angle measuring device for microwave Bragg experiment

An angle measuring device, microwave Bragg technology, applied in the direction of angle/taper measurement, etc., can solve the problems of easy error and low measurement accuracy, and achieve the effect of accurate and high-precision measurement

Active Publication Date: 2016-08-03
EAST CHINA NORMAL UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The invention overcomes the defects of low measurement accuracy and easy error generation in the prior art, and proposes a high-precision angle measurement device and its measurement method for microwave Bragg experiments

Method used

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  • A measuring method of angle measuring device for microwave Bragg experiment
  • A measuring method of angle measuring device for microwave Bragg experiment
  • A measuring method of angle measuring device for microwave Bragg experiment

Examples

Experimental program
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Embodiment 1

[0056] This embodiment describes the microwave Bragg experimental measurement process of the 100-plane crystal plane. First align the normal of face 100 with the zero mark of vernier disc 2. For crystal planes whose angles between the normal direction of the crystal plane and the normal direction of the 100 crystal plane are integer degrees, the precision is 0.25°, and the measurement method of microwave Bragg diffraction is that the incident angle is equal to the reflection angle. Take the 100-face as an example: the incident direction first starts from 30°, and then measures every 0.5° until 140°. Every time the position of the zero scale line of the vernier disc 2 increases by 0.5°, the pointer connected to the receiver, that is, the second The pointer 42 moves back by 1° to ensure that the angle of incidence is equal to the angle of reflection. At this time, the first data of microwave Bragg diffraction with an angle of incidence equal to the angle of reflection with an ac...

Embodiment 2

[0058] In this embodiment, a method for measuring normal incidence on a crystal plane whose included angle with the 100 plane is not an integer is described. Taking the vertical incidence of the 120 plane as an example, the angle between the 120 plane and the 100 crystal plane is 26.6°. To achieve the vertical incidence, the vernier disk 2 must be used to improve the accuracy of the angle and rotate the 100 crystal plane. Based on the above embodiment, Rotate the vernier plate 2 to the position of 26.5°6'. Keeping the incident angle constant, move the pointer of the receiver, start from 30° and measure every increment of 0.5°, and finally obtain the microwave Bragg diffraction data of the perpendicular incidence 120 surface whose angle of incidence is not equal to the angle of reflection.

Embodiment 3

[0060] In this embodiment, the incident angle equals to the reflection angle of any surface with higher precision is measured by microwave Bragg diffraction. Taking 100 surfaces, the measurement accuracy is 0.1° (the highest accuracy of the present invention is 1′) as an example: the incident angle starts from 30.1°, and is measured sequentially with each increase of 0.1°. The angle of incidence is equal to the angle of reflection, so when the angle of incidence is 30.1°, the angle between the angle of incidence and the angle of reflection is 60.2°. First calibrate the zero scale line, keep the dial 1 still, move the vernier 2 to the position where the angle is 60.2°, then turn the dial 1, and keep the relative stillness between the dial 1 and the vernier 2, so that the first pointer 41 points to The 60.2° scale line on the vernier dial. Next, move the second pointer 42 connected to the receiver to the zero scale line on the dial 1 , and this step can also be performed at the...

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Abstract

The invention discloses a high-accuracy angle measuring device for a microwave Prague experiment. The high-accuracy angle measuring device comprises a dial, an alidade, a shaft and a pointer group, the dial is provided with a first group of angle indexes, the alidade and the dial are coaxially arranged, the alidade is provided with a second group of angle indexes, the shaft is arranged at the centers of the dial and the alidade, the dial and the alidade rotate around the shaft, and the pointer group comprises two pointers which are used for indicating angle values of the first group of angle indexes or the second group of angle indexes. The measuring device has higher measuring accuracy. The invention further discloses a measuring method of the high-accuracy angle measuring device for the microwave Prague experiment.

Description

technical field [0001] The invention relates to a microwave experiment measurement technology, in particular to an angle measurement device and a measurement method for a microwave Bragg experiment. Background technique [0002] The microwave Bragg diffraction experiment is used to simulate X-ray diffraction. In this experiment, an enlarged simulated crystal is used to replace the real crystal, and a beam of centimeter-scale microwaves is used to replace X-rays. When it is incident on the simulated crystal, observe the reflection of the incident wave on different crystal surfaces; study the conditions (2dsinθ=Kλ) that the reflected wave meets to interfere with the microwave wavelength, the lattice constant of the "crystal" and the diffraction angle. relationship, so as to gain some basic understanding of the crystal structure analysis method. In the microwave Bragg diffraction experiment, because the minimum scale of the dial is 1 degree, the angular accuracy can be used to...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B5/24
Inventor 关沁媚吴琼李如琴田海军阮建中王春梅沈国土
Owner EAST CHINA NORMAL UNIV