Thin film test sample platform of X-ray diffraction instrument

Abstract

The invention provides a thin film test sample platform of an X-ray diffraction instrument. The thin film test sample platform is formed by a fixing bracket, three springs, a flat plate type sample holder and an adjusting screw, wherein the fixing bracket is in a right-angle Z shape; a screw hole and three spring hook holes are formed in the center of a flat plate below the fixing bracket; three spring pull hook holes are also formed in the flat plate type sample holder; the flat plate type sample holder passes through the three springs to be respectively connected with the fixing bracket through the pull hook holes; the adjusting screw penetrates through the screw hole of the fixing bracket to be contacted with the lower bottom face of the sample holder; the height of the sample holder can be freely adjusted through the adjusting screw; finally, the surface of a sample and the upper surface of the fixing bracket are on the same plane. According to the thin film test sample platform, X-ray diffraction measurement of the samples with the different specifications can be conveniently carried out, and particularly, the X-ray diffraction measurement of thin film samples with different substrate thicknesses can be realized.

Description

technical field [0001] The invention is related to the measurement of X-ray diffractometer samples, especially the measurement of thin film samples, which can be used for the measurement of thin film samples and other powder samples. technical background [0002] X-ray diffraction measurement is an important means to identify the phase structure of materials. When X-rays are incident on the crystal surface of a lattice lattice at a grazing angle θ, under the conditions of Bragg's equation, diffraction lines strengthened by superposition will be obtained in the reflection direction. The reflection is obtained from the reflective surface that meets the conditions of the Bragg equation at each θ angle. After measuring θ, the lattice spacing of the material, the size and type of the unit cell, etc. can be determined. According to the intensity of the diffraction line, the unit cell can be further determined. Arrangement of atoms in the interior. In the X-ray diffraction measur...

AI Technical Summary

Problems solved by technology

[0003] The present invention aims to solve the problem of poor versatility of the sample stage in X-ray diffraction measurement, and provides a new type of X-ray diffractometer film sample test bench, which also has good applicability to powder samples

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