Method for determining flaw detection benchmark sensitivity of steel plate by single crystal probe
A reference sensitivity, single crystal probe technology, applied in the use of sound waves/ultrasonic waves/infrasonic waves to analyze solids, use sound waves/ultrasonic waves/infrasonic waves for material analysis, measurement devices, etc., can solve the problem of different, adjust the reference sensitivity and determine the transmission compensation. and other issues to achieve the effect of highlighting substantive characteristics
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Examples
specific Embodiment approach 1
[0020] The method of using a single crystal probe to determine the reference sensitivity of steel plate flaw detection in this program includes the following steps:
[0021] 1) Select the test block according to the thickness of the steel plate to be measured, and the test block has a flat-bottomed hole with a diameter of 5 mm and a specified buried depth;
[0022] 2) Use the single crystal probe of the flaw detector to detect the maximum wave height △1dB value of the flat bottom hole of the test block; the single crystal probe is a manual flaw detection single crystal probe with a working frequency of 5 MHz;
[0023] 3) Use the single crystal probe in step 2) to measure the △2dB value at the large flat bottom of the test block;
[0024] 4) Determine the correction value δ according to step 2) and step 3), δ=△1-△2;
[0025] 5) When performing flaw detection on the steel plate, adjust the bottom wave height of the intact part of the steel plate to 50% of the full scale of the ...
specific Embodiment approach 2
[0027] The method of using a single crystal probe to determine the reference sensitivity of steel plate flaw detection in this program includes the following steps:
[0028] 1) Select the test block according to the thickness of the steel plate to be measured, and the test block has a flat-bottomed hole with a diameter of 5 mm and a specified buried depth;
[0029] 2) Use the single crystal probe of the flaw detector to detect the maximum wave height △1dB value of the flat bottom hole of the test block; the single crystal probe is a manual flaw detection single crystal probe, and the working frequency is 2.5 MHz;
[0030] 3) Use the single crystal probe in step 2) to measure the △2dB value at the large flat bottom of the test block;
[0031] 4) Determine the correction value δ according to step 2) and step 3), δ=△1-△2;
[0032] 5) When performing flaw detection on the steel plate, adjust the bottom wave height of the intact part of the steel plate to 50% of the full scale of ...
specific Embodiment approach 3
[0035] The method of using a single crystal probe to determine the reference sensitivity of steel plate flaw detection in this program includes the following steps:
[0036] 1) Select the test block according to the thickness of the steel plate to be measured, and the test block has a flat-bottomed hole with a diameter of 5 mm and a specified buried depth;
[0037] 2) Use the single crystal probe of the flaw detector to detect the maximum wave height △1dB value of the flat bottom hole of the test block; the single crystal probe is a manual flaw detection single crystal probe with a working frequency of 2.5 MHz;
[0038] 3) Use the single crystal probe in step 2) to measure the △2dB value at the large flat bottom of the test block;
[0039] 4) Determine the correction value δ according to step 2) and step 3), δ=△1-△2;
[0040] 5) When performing flaw detection on the steel plate, adjust the bottom wave height of the intact part of the steel plate to 50% of the full scale of th...
PUM
Property | Measurement | Unit |
---|---|---|
diameter | aaaaa | aaaaa |
diameter | aaaaa | aaaaa |
thickness | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com