Testing method of power consumption of electric device
A technology of electronic equipment and testing methods, which is applied in the direction of measuring electricity, measuring devices, and measuring electrical variables, etc., can solve the problems of no reservation, power consumption test cannot be carried out smoothly, etc., and achieve the effect of simple and convenient operation and accurate test results
Inactive Publication Date: 2013-09-25
FUZHOU ROCKCHIP SEMICON
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Problems solved by technology
[0004] When analyzing the power consumption of PDA, MOBILE PHONE and other electronic products, there may not be a 0.1Ω current test resistor reserved on the circuit under test, which may cause the power consumption test to fail.
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[0013] Such as figure 2 As shown, the method for testing the power consumption of electronic equipment of the present invention is to add an external power supply to the test point of the system power supply circuit of the original electronic product to realize the test. The electronic equipment includes a system power supply and a voltage conversion chip, the voltage conversion chip converts the system power supply into at least one DCDC output power supply and / or at least one LDO output power supply, and the test method is to test the DCDC output power supply An external power supply is added to the power supply circuit or the LDO output power supply circuit, and the voltage of the external power supply is slightly higher than the voltage of the DCDC output power supply or the voltage of the LDO output power supply, so that the DCDC output power supply or the LDO output power supply is blocked. At this time The DCDC output power supply circuit or the LDO output power supply...
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The invention provides a testing method of the power consumption of an electric device. The electric device comprises a system power supply and a voltage converting chip. The voltage converting chip converts the supply power supply into at least one DCDC output power supply and / or one LDO output power supply. According to the testing method, an external power supply is added to a DCDC or LDO output power supply circuit, the voltage of the external power supply is higher than the voltage of the DCDC or LDO output power supply, and at the moment, power of the DCDC or LDO output power supply circuit is provided by the external power supply; the difference between the power consumption before the external power supply is added to the system power supply end and the power consumption after the external power supply is added to the system power supply end is the power consumption of the DCDC or LDO output power supply circuit at the system power supply end; the power consumption of the power supply circuit of the external power supply is the power consumption of the DCDC or LDO output power supply circuit. The testing method is easy and convenient to operate actually and accurate in testing results.
Description
technical field [0001] The invention relates to a method for testing the power consumption of electronic equipment, in particular to a method for testing the power consumption of electronic products such as PDA and MOBILE PHONE. Background technique [0002] PDA, MOBILE PHONE and other electronic products will involve power consumption analysis. The traditional test is to add measurement resistors in each power supply circuit. This can only be applied in the product development stage. The real product is affected by the layout and wiring, so it cannot be added. Resistance, so a method of power consumption test without changing the PCB device and layout is needed. [0003] Such as figure 1 As shown, the schematic diagram of the system power supply of PDA, MOBILE PHONE and other electronic products can be summarized as including a system power supply (2.9~4.2V, 3.8V in the figure) and a voltage conversion chip (the voltage conversion chip is a discrete DCDC, LDO, or integrat...
Claims
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Inventor 谢修鑫许盛飞宋秀杰
Owner FUZHOU ROCKCHIP SEMICON