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Quarter-wave plate phase retardation measuring device and measuring method

A wave plate phase and measurement device technology, which is applied in the direction of testing optical properties, etc., can solve the problems of complex device and inconvenient operation, and achieve the effect of simple device, convenient operation and compact structure

Active Publication Date: 2013-10-02
BEIJING GUOWANG OPTICAL TECH CO LTD
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  • Claims
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Problems solved by technology

However, this method uses two photoelastic modulators with different modulation frequencies and a lock-in amplifier with different lock-in frequencies, and the device is complex and inconvenient to operate.

Method used

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  • Quarter-wave plate phase retardation measuring device and measuring method
  • Quarter-wave plate phase retardation measuring device and measuring method
  • Quarter-wave plate phase retardation measuring device and measuring method

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Embodiment Construction

[0020] The present invention will be further described below in conjunction with the accompanying drawings and embodiments, but the protection scope of the present invention should not be limited thereby.

[0021] see first figure 1 , figure 1 It is a structural block diagram of an embodiment of a measuring device for quarter-wave plate phase delay in the present invention. As can be seen from the figure, the measuring device of the quarter-wave plate phase retardation of the present invention consists of a collimated light source 1, a circular polarizer 2, a photoelastic modulator 3, a circular analyzer 5, a photodetector 6, and a photoelastic control device 7, lock-in amplifier 8 and computer 9, and its positional relationship is:

[0022] Along the advancing direction of the beam emitted by the collimated light source 1 are the circular polarizer 2 , the photoelastic modulator 3 , the circular analyzer 5 , the photodetector 6 and the photoelastic controller 7 in sequence....

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Abstract

The invention provides a quarter-wave plate phase retardation measuring device and measuring method. The device comprises a collimation light source, a round polarizer, a photoelastic modulator, a round analyzer, a photoelectric detector, a photoelastic controller, a phase locking amplifier and a computer. According to the device and the method, only one photoelastic modulator is needed to measure the phase retardation of a quarter-wave plate; the device is simple, has a compact structure and is convenient to operate.

Description

technical field [0001] The invention relates to the technical field of polarization measurement, in particular to a measuring device and a measuring method for the phase delay of a quarter-wave plate. technical background [0002] Waveplates are widely used in polarized illumination, biological detection, optical detection and other fields. Quarter-wave plates are an essential type of polarizing device, often used in conjunction with linear polarizers to produce circularly polarized light. The phase retardation is an important parameter of the quarter-wave plate. In order to improve the performance of the polarization optical system, it is necessary to accurately measure the phase retardation of the quarter-wave plate in the polarization optical system. [0003] The prior art [1] (Baoliang Wang, Linear birefringence measurement instrument using two photoelastic modulators, Opt. Eng. 41(5), 981-987, 2002) describes the method of using two photoelastic modulators to measure t...

Claims

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Application Information

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IPC IPC(8): G01M11/02
Inventor 曾爱军邓柏寒刘龙海朱玲琳黄惠杰
Owner BEIJING GUOWANG OPTICAL TECH CO LTD
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