High-frequency vibration clamp device for scanning ion conductance microscope

Abstract

The invention discloses a high-frequency vibration clamp device for a scanning ion conductance microscope. The clamp device comprises a tubular clamp sleeve for clamping a glass micropipette probe, wherein an annular flange is arranged outside the tubular clamp sleeve; the lower part of the annular flange is connected with an elastic element; the lower end of the elastic element is fixed to a fixing bottom plate; an annular piezoelectric ceramic piece is arranged on the upper surface of the annular flange; the annular piezoelectric ceramic piece is fixedly connected onto a fixing top plate; the fixing bottom plate is fixedly connected with the fixing top plate; the annular piezoelectric ceramic piece vibrates after being communicated with a drive circuit to drive the tubular clamp sleeve and the glass micropipette probe to generate a high-frequency vibration in the vertical direction. According to the clamp device, the independently driven annular piezoelectric ceramic piece is adopted and driven to vibrate for driving the glass micropipette probe to generate the high-frequency vibration in the vertical direction to generate an alternating-current feedback signal so as to effectively overcome the ionic current drift and increase the scanning speed.

Description

technical field [0001] The invention belongs to the technical field of scanning ion conductance microscope imaging, and relates to a high-frequency vibration holder of a scanning ion conductance microscope. Background technique [0002] Scanning ion conductance microscopy (SICM), as a member of the scanning probe microscope family, is currently widely used in nanoscale biological imaging (such as imaging of cardiomyocytes, renal epithelial cells, neurons, etc.), A new type of microscope to study biological structure and function. Scanning ion conductance microscopy can perform non-contact, non-damaging, nanoscale resolution imaging of the tested sample under liquid physiological conditions, and does not require the tested sample to be conductive, so it has very prominent advantages in the field of imaging of living cells . [0003] One of the main problems in the scanning process of scanning ion conductance microscopy is the drift of ion current. The reasons for the drift...

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Problems solved by technology

[0006] The problem to be solved by the present invention is to provide a high-frequency vibration holder for a scanning ion conductance microscope to solve the problem of ion current drift during the scanning process of the scanning ion conductance microscope, and at the same time improve the scanning speed and imaging capability of the scanning ion conductance microscope

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