Swing arm type contourgraph measuring head alignment calibration device with rotating sensor
A technology for calibrating devices and profilometers, applied to measuring devices, optical devices, instruments, etc., can solve problems such as inability to reflect surface shape errors and lack of centering methods
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[0026] Such as figure 1 As shown, it is a schematic structural diagram of the centering calibration device of the swing arm profiler probe with sensor rotation, including the profiler probe 1, the profiler probe fine-tuning mechanism 2, the cross arm 3, the column 4, the counterweight 5, and the cross arm turntable 6. The workpiece turntable 7 and the optical probe 8. The profilometer probe 1 is a high-precision contact probe with a resolution of 25nm and a measurement accuracy of 50nm. The fine-tuning mechanism 2 of the profiler measuring head can realize the fine-tuning of 5 degrees of freedom of X, Y, Z, pitch and yaw. The cross arm 3 and the column 4 are used to connect the cross arm turntable 6 and the profilometer probe 1 to complete the rotary motion of the profilometer probe 1 . The counterweight 5 is used to balance the profiler probe 1 , the profiler probe fine-tuning mechanism 2 and the cross arm 3 to ensure that the cross arm turntable 6 maintains a stable rotati...
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