Potato defect detecting method

A defect detection and potato technology, applied in the direction of optical testing flaws/defects, etc., can solve the problems of time-consuming, labor-intensive, easy to be affected by human behavior, and accurately identify inferior potatoes, so as to reduce production costs, improve draft efficiency, and improve positive solutions. rate effect

Inactive Publication Date: 2013-10-09
JIANGSU UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This method is time-consuming and labor-intensive, and the identification method based on human senses is easily affected by human behavior and

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0022] 1 Wash 50 potatoes peeled by steam for 15 minutes with water at 5°C, take them out, and dry them with airflow at room temperature.

[0023] 2 Transfer the potatoes to a metal plate under running water at 15°C to keep the temperature stable. Heat the potatoes with an infrared lamp, the power of the bulb is 250W, the distance between the bulb and the potato is 35cm, and the heating time is 0.5min.

[0024] 3 Take pictures with an infrared camera, the camera lens is 35cm away from the potato, and the thermal image taken is transmitted to the computer.

[0025] 4 Carry out mean filtering and denoising on the thermal image, use the threshold segmentation method to extract the area of ​​the potato thermal image, calculate the average temperature value of the pixels in the area, and then calculate the difference between the temperature value of each pixel point in the area and the average temperature value, Calculate the area of ​​the real object corresponding to the pixel po...

Embodiment 2

[0028] 1 Wash 50 potatoes peeled by steam for 10 minutes with running water at 15°C, take them out, and dry them with airflow at room temperature.

[0029] 2 Transfer the potatoes to a metal plate under running water at 30°C to keep the temperature stable. Heat the potatoes with an infrared lamp, the power of the bulb is 250W, the distance between the bulb and the potato is 80cm, and the heating time is 1min.

[0030] 3 Take photos with an infrared camera, the camera lens is 80cm away from the potato, and the infrared photos taken are transmitted to the computer.

[0031] 4 Carry out mean filtering and denoising on the thermal image, use the threshold segmentation method to extract the area of ​​the potato thermal image, calculate the average temperature value of the pixels in the area, and then calculate the difference between the temperature value of each pixel point in the area and the average temperature value, Calculate the area of ​​the real object corresponding to the ...

Embodiment 3

[0035] 1 Rinse 50 steam-peeled potatoes with running water at 30°C for 3 minutes, take them out, and dry them with airflow at room temperature.

[0036] 2 Transfer the potatoes to a metal plate under running water at 5°C to keep the temperature stable. The potatoes were heated with an infrared lamp, the power of the bulb was 250W, the distance between the bulb and the potato was 55cm, and the heating time was 40 s.

[0037] 3 Take photos with an infrared camera, the camera lens is 55cm away from the potato, and the infrared photos taken are transmitted to the computer.

[0038] 4 Carry out mean filtering and denoising on the thermal image, use the threshold segmentation method to extract the area of ​​the potato thermal image, calculate the average temperature value of the pixels in the area, and then calculate the difference between the temperature value of each pixel point in the area and the average temperature value, Calculate the area of ​​the real object corresponding t...

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PUM

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Abstract

The invention discloses a potato defect detecting method. According to the potato defect detecting method, a thermal imaging technology is used for rapidly recognizing peeled potatoes which are damaged, rot and sprout, and the thermal image processing processes of a computer are as follows: carrying out median filtering or average filtering and noise reduction on thermal images, extracting the regions of the potato thermal images by adopting a threshold value segmentation method, calculating the average temperature values of pixels in the regions, then calculating the difference value between the temperature value of each pixel in the regions and the average temperature value, and calculating the areas S of real objects to which the pixels with the absolute values of the difference values being greater than 1 DEG C, if S is greater than 25mm<2>, the potatoes are defective. The potato defect detecting method disclosed by the invention has high efficiency and good recognition accuracy and can be popularized and applied to the field of potato defect detection.

Description

technical field [0001] The invention relates to a method for quickly identifying potato quality, in particular to a method for quickly identifying defective potatoes by using a thermal imaging method, and belongs to the field of non-destructive testing. Background technique [0002] Potatoes are one of the four major food crops in today's human society, second only to rice, corn and wheat. Potatoes contain a lot of starch, which can provide rich nutritional energy for eaters. With the rapid development of the food industry, the ways of eating potatoes are becoming more and more diverse, and the demand for mashed potatoes and potato cakes based on whole potato powder is increasing. [0003] Potato powder has the advantages of steamed fresh potato flavor, less nutritional loss, good quality stability, convenient processing and easy forming, so it is widely used in compound French fries / chips, instant mashed potatoes, fast food (or quick-frozen), Puffed and baby food, etc., a...

Claims

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Application Information

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IPC IPC(8): G01N21/88
Inventor 陈斌陆道礼颜辉田桂华
Owner JIANGSU UNIV
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