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Testing system and testing method

A testing method and a tested technology, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve the problems that affect the reliability of the test, cannot guarantee that the hard disk is completely detected, and take a lot of time.

Inactive Publication Date: 2013-10-23
HONG FU JIN PRECISION IND (SHENZHEN) CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, the disadvantages of this power-on / off test technology are as follows: First, because the power-on / off fixture is not connected to the computer, the power-on / off fixture only transmits and cuts power to the storage device according to the set power-on / off interval, so there is no guarantee All the hard disks on the storage device are completely detected every time the storage device is turned on and off; secondly, although some power-on and off fixtures can display the number of times the power is turned on and off, they often fail because the signal is transmitted to the computer. There is an error in the calculation of the time and the number of seconds of the switch fixture itself, which causes the number of times displayed on the computer to be different from that of the switch fixture. The testers need to spend a lot of time to determine whether it is a problem with the computer software or the switch fixture, which not only wastes Manpower and equipment costs will also affect the reliability of the test

Method used

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Embodiment Construction

[0016] figure 1 It is a block diagram of a preferred embodiment of the switch machine testing system of the present invention. The power-on / off test system 10 is connected to a device under test 20 and can perform a power-on / off test on the device under test 20 . The device under test 20 can be a storage device, such as a SAS JBOD (Just a Bunch Of Disks), FC JBOD, or a server, and the storage device will be used as an example for description below.

[0017] The switching machine testing system 10 includes a switching machine fixture 100 , a single chip microcomputer 300 and a computer 500 . The switch fixture 100 is connected to the storage device 20 and is used for power supply and power-off to the storage device 20 . The single-chip microcomputer 300 is connected to the switch fixture 100 and the computer 500 , and is used to receive a switch command from the computer 500 to control the switch fixture 100 to power on and off to the storage device 20 .

[0018] The compute...

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Abstract

A testing method implemented by a testing system connected to an device includes generating a power on control signal according to preset test parameters and sending to the single chip; controlling a relay to power on the device according to the power on control signal; testing whether the device is successfully powered on; testing whether information of the device is successfully read out during the powering on of the device; testing whether the device is successfully powering off when the device is successfully powered on and the information is successfully read out, ending testing when the device is not successfully powered on and / or the information is not successfully read out, and recording a test result. A testing system is also provided.

Description

technical field [0001] The invention relates to a test system and a test method, in particular to a switch machine test system and a test method. Background technique [0002] The storage device is composed of one or more PCMs (Processor Control Modules) connected to one or more JBOD storage devices. Currently, there are SAS JBOD, FC JBOD and so on. JBOD (Just a Bunch Of Disks, disk cluster) is a storage device with multiple disk drives installed on a backplane. These storage devices all place multiple hard disks on the same storage device, and do not necessarily have an operating system themselves. These storage devices can be connected by another computer with an operating system through an HBA (Host Bus Adapter) card to achieve the purpose of reading and storing data. [0003] In order to ensure that the storage device can be powered on smoothly and ensure the reliability of its power-on and power-off times, it is necessary to perform power-on and power-off tests. Know...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
CPCG01R31/00G06F1/26
Inventor 袁才进
Owner HONG FU JIN PRECISION IND (SHENZHEN) CO LTD