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Data receiving device and testing method thereof

A data and receiver technology, applied in the field of data receiving device and its testing, can solve the problem that the receiver cannot perform the test, the cost of the test increases, etc.

Active Publication Date: 2017-08-04
SAMSUNG ELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In this case, the provision of additional design blocks can be avoided, but the receiver itself cannot perform the test, and the test is performed at the package level instead of the wafer level
Additionally, the cost of testing in mass production increases

Method used

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  • Data receiving device and testing method thereof
  • Data receiving device and testing method thereof
  • Data receiving device and testing method thereof

Examples

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Embodiment Construction

[0019] Hereinafter, the inventive concept will be described more fully with reference to the accompanying drawings, in which embodiments of the invention are shown. This invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art. In the drawings, the size and relative sizes of layers and regions may be exaggerated for clarity. Like reference numerals refer to like elements throughout.

[0020] It will be understood that when an element is referred to as being "connected" or "coupled" to another element, it can be directly connected or coupled to the other element or intervening elements may be present. In contrast, when an element is referred to as being "directly connected to" or "directly coupled to" another element, there are no...

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PUM

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Abstract

A data receiver apparatus includes a logic unit configured to generate a test mode signal, receive a test result signal in the test mode, and perform a test by comparing the test mode signal with the test result signal in the test mode. The data receiver also includes: a system frequency control circuit configured to multiply the reference clock signal by a multiplication factor received from the logic unit, and output a test clock signal; an output terminal configured to serialize the test mode signal based on the test clock signal and output the output signal; the input terminal is configured to recover the data signal and the data clock signal from the input signal based on the output signal, perform serial-to-parallel conversion on the data signal based on the data clock signal, and output the test result signal to the logic unit .

Description

technical field [0001] Priority is claimed from Korean Patent Application No. 10-2012-0035127 filed with the Korean Intellectual Property Office on Apr. 4, 2012, the disclosure of which is hereby incorporated by reference in its entirety. Background technique [0002] Embodiments of the inventive concept relate to a data receiver device including a built-in self-test function and related methods. [0003] Built-in self-test (BIST) is a test in which the chip itself determines whether it has an operational fault. The BIST function is considered important for verifying the performance of chips developed in mass production. BIST checks the bit error rate (BER), frequency and other operating parameters of the chip. [0004] The BIST function of the chip is obtained by integrating the BIST function block into the chip. At this time, the BIST function blocks are implemented differently depending on whether the chip is a transceiver chip including both a transmitter and a receiv...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/3187
CPCG01R31/31715G01R31/28G01R31/3177
Inventor 蔡现洙辛钟信
Owner SAMSUNG ELECTRONICS CO LTD