Light-emitting element spot measurement machine

Abstract

The invention discloses a light-emitting element spot measurement machine. Electrical properties are applied to make light-emitting elements be connected and emit light, and then the optical property data of the light-emitting elements are collected. The light-emitting element spot measurement machine comprises a bearing platform, a set of probes, a first optical property collecting device and a second optical property collecting device, wherein the bearing platform is provided with a bearing position for forming a spanning and erecting space which is used for bearing and placing at least one light-emitting element; the probes make contact with the light-emitting elements and provide the electrical properties needing applying; the first optical property collecting device is correspondingly arranged above the bearing platform and collects light upwards emitted by the light-emitting elements after being connected; the second optical property collecting device is correspondingly arranged below the bearing platform and collects light downwards emitted by the light-emitting elements after being connected. The second optical property collecting device can be also replaced by an optical property reflecting device which is used for reflecting the light downwards emitted by the light-emitting elements to the first optical property collecting device. According to the light-emitting element spot measurement machine, the light downwards emitted by the light-emitting elements can be made to directly enter a light collector without transmitting through a bearing body, so that the detecting result is prevented from being affected by the factors of light transmittance, the change of light marching angles and the like.

Description

technical field [0001] The present invention relates to a light-emitting element point measuring machine, especially a bearing position that provides a straddling space, so that the light emitted by the light-emitting element can enter the light collector without passing through the carrier. Spot testing machine for light-emitting elements. Background technique [0002] Please refer to Figure 10 , is a representative diagram of China Taiwan Invention Patent Application Publication No. 201133695A1. As shown in the figure, a wafer carrying and fixing device includes a frame body 31 and a plurality of fixing units 32; the fixing units 32 are arranged on one side of the frame body 31, and each fixing unit 32 includes a pivot 321, a pivot arm 322 and a limit portion 323; the pivot arm 322 is pivotally connected to the frame body 31 through the pivot shaft 321, and is magnetically adsorbed to the frame body 31; wherein, a crystal placed on the frame body 31 The disk 2 can be at...

AI Technical Summary

Problems solved by technology

Those who are familiar with this technology know that the known method of the wafer tray 2 is to use the blue film to spread it out, place the wafer to be tested on the blue film, and then place it on a carrier plate for spot measurement, or directly place it Work on the carrier plate, regardless of the above methods, because there are obstacles under the object to be tested, which only limit the specific form of the object to be tested that emits light upwards, and cannot be used for the point of the object to be measured that emits light from both sides Measurement

[0004] Also, please refer to Figure 11 , is a representative diagram of China Taiwan Invention Patent Application Publication No. 201109635A1, the object to be tested, i.e. light-emitting diode 21, is placed on a transparent carrier board 20, however, the light-emitting diode 21 emits downward during the test The light is transmitted through the transparent carrier plate 20 made of transparent material. Since the light that passes through the medium of the transparent carrier plate 20, the light emitted downward will deviate from its scattering angle, and the factor of the light transmittance of the carrier plate will also affect the light collection. Efficiency, especially when the lower light detection device 40 is the light entrance of the integrating sphere 41 must be accurately calculated, the result of the detected LED 21 will be inaccurate

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