Cooling system and cooling method of semiconductor light source bar in aging test

Abstract

The invention discloses a cooling system for a semiconductor light source bar in an aging test, comprising a fixture for clamping a semiconductor light source bar, the fixture includes a housing, and the housing has a water inlet channel and a water outlet channel communicating with each other ; the first water tank connected to the water inlet channel, cooling liquid is housed in the water tank; the second water tank connected to the water outlet channel; and the suction device connected to the water outlet channel, the suction device At least the cooling liquid in the first water tank is sucked into the second water tank, so as to scour the bottom of the semiconductor light source bar to reduce its temperature. The invention can dissipate the heat generated by the semiconductor light source strip during the aging test and evenize the local temperature, so as to maintain the temperature required by the aging test and improve the thermal stability of the HAMR head. The invention also discloses a corresponding cooling method.

Description

technical field [0001] The present invention relates to a cooling system and a cooling method for a semiconductor light source bar in an aging test, in particular to a cooling system and a cooling method for a laser diode bar used in a heat assisted magnetic recording (HAMR) device in an aging test . Background technique [0002] A disk drive unit is a common information storage device. Figure 1a is a schematic diagram of a typical disk drive unit 100 . It includes a series of rotatable disks 101 mounted on a spindle motor 102 , and a head stack assembly (HSA) 130 . The HSA 130 includes at least one motor arm 104 and a HGA 150 . Typically, a voice-coil motor (spindling voice-coil motor, VCM) (not shown) is provided to control the movement of the motor arm 104 . [0003] refer to Figure 1b , the HGA 150 includes a magnetic head 103 having a HAMR head (not shown in the figure) and a suspension member 190 supporting the magnetic head 103 . The cantilever 190 includes a l...

AI Technical Summary

Problems solved by technology

However, this method will bring about the problem of uneven temperature

Due to the local heat generated on the semiconductor light source bar and accumulated in it during the burn-in test, the temperature in the semiconductor light source bar is uneven and the heat cannot be dissipated properly

When the local temperature of a semiconductor light source bar, such as a laser diode, increases, on the one hand, the conversion efficiency from electrical input to optical output decreases, so for a fixed electrical input, its laser output decreases; on the other hand, due to the laser The local temperature rise of the diode may exceed the temperature required for the burn-in test, thereby affecting or destroying the test results of the laser diode, thereby affecting the performance of the HAMR head

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