Method for calculating irregular defect scattering sound field under action of rotation sound field
A calculation method and scattering sound technology, applied in calculation, special data processing applications, instruments, etc., can solve problems such as large amount of calculation, complex calculation process, and difficulty in meeting application requirements with traditional calculation efficiency, and achieve the effect of reducing the degree of freedom
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- Publication Date
- 2014-02-12
Smart Images
Figure 1 Figure 2 Figure 3
Abstract
Description
technical field
[0001] The invention belongs to the technical field of industrial ultrasonic nondestructive testing, and relates to a calculation method of an irregular defect scattering sound field under the action of a rotating sound field. Background technique
[0002] As cylindrical parts or raw materials widely used in the fields of national economy and national defense construction, pipes, shafts and bars have always had a strong demand for non-destructive testing technology. Ultrasonic non-destructive testing technology has become the most widely used detection technology in the field of industrial non-destructive testing due to its incomparable advantages in terms of safety, applicability, automation capabilities, and richness of characteristic parameters. Through the full spiral scanning detection of the ultrasonic transducer array rotation and the linear motion of the object to be inspected, a global rotating ultrasonic field is generated. In terms of the completen...
Examples
Embodiment Construction
[0026] The present invention will be further described below in conjunction with accompanying drawing.
[0027] Such as figure 1 As shown, through the rotation of the ultrasonic transducer array, the full-range spiral scanning detection technology of the linear motion of the object to be detected generates a global rotation detection sound field. During the detection process, the characteristics of the incident sound field are constantly changing with the movement, and the spatial position and attitude of the defect relative to the sound field are constantly changing. The traditional scattering sound field calculation method is difficult to meet the high calculation efficiency required by the application.
[0028] Such as figure 2 As shown in , according to the characteristic parameters of defect scatterers such as geometric size, spatial position, attitude orientation and material properties, the defect is surrounded by a bounding box of suitable shape, and the scattered so...