Joint optimization algorithm for rapid inversion of single-layer surface dielectric parameters and roughness parameters based on radar backscattering measured data
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- XIDIAN UNIV
- Publication Date
- 2017-02-08
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Abstract
Description
technical field
[0001] The invention relates to the technical field of microwave remote sensing, in particular to a joint optimization algorithm for fast inversion of single-layer surface dielectric parameters and roughness parameters based on radar measured data. Background technique
[0002] The research on electromagnetic scattering and electromagnetic inverse scattering plays an extremely important role in microwave remote sensing. The radar technology of ground-based microwave remote sensing has made great progress in recent years. In the microwave remote sensing of typical surfaces such as land and ocean, the backscattered echoes are closely related to the physical parameters of the surface and soil moisture, etc., and contain a lot of surface information. For example, the soil moisture content can be obtained by using surface microwave remote sensing technology. Therefore, scientific research in the field of inverse scattering will have a significant impact on the dev...