Lifting device controlling measuring head to move and be positioned on Z axis

Abstract

The invention discloses a lifting device controlling a measuring head to move and be positioned on the Z axis. The lifting device comprises a base, a guide rail, a fixed pulley, a balancing weight and a steel wire tope. The guide rail is perpendicularly installed on the base along the Z axis, the fixed pulley is installed at the top end of the guide rail, the steel wire rope winds around the fixed pulley, one end of the steel wire rope is connected with the balancing weight, the other end of the steel wire rope is connected with a mechanical arm, and the mechanical arm is connected to the guide rail and moves along the guide rail. The lifting device further comprises an accurate adjustment mechanism composed of a gear, a rack, a gear shaft and a turning wheel handle. The lifting device controlling the measuring head to move and be positioned on the Z axis has the advantages that lifting motion and positioning of the measuring head on the Z axis are achieved, the moving position accuracy is accurately controlled, and the handle is easy and convenient to operate and control.

Description

technical field [0001] The invention relates to a lifting device for controlling the movement of components, in particular to a lifting device for controlling the movement and positioning of a test head on the Z axis. Background technique [0002] The automatic testing of integrated circuits and other electronic wafers requires special testing procedures to be tested at an appropriate temperature and at an appropriate location. Wafer test itself is a large and expensive automated test system consisting of a test head interfaced with the main body of the device handler. In such test equipment, the test head uses high-precision frequency control equipment and electronic circuits for data signals, so it is very heavy, about 40 to 300 kg, and the mechanical arm connected to the test head is also very heavy. The header must be tightly integrated with the main body of the device handler for accurate high-speed testing. [0003] The movement and positioning of the test head are v...

AI Technical Summary

Problems solved by technology

[0003] The movement and positioning of the test head are very important. In the six degrees of freedom of the test head movement and rotation, precise positioning must be carried out, which greatly increases the difficulty of the test head docking to meet the test requirements.

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