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Near Field Millimeter Wave Imaging

A near-field imaging and image technology, used in radio wave measurement systems, radio wave reflection/re-radiation, antennas, etc., and can solve problems such as low resolution and high cost

Active Publication Date: 2016-05-18
INT BUSINESS MASCH CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

As such, two major drawbacks of current far-field imagers that prevent their use in medical applications are high cost and low resolution set by diffraction limitations.

Method used

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Embodiment Construction

[0029] Exemplary embodiments of the present invention are now described in further detail, and relate to systems and methods for near-field millimeter-wave imaging, in particular, to scanning an object by using sub-wavelength probe elements and capturing and measuring the phase and sum of reflected energy. Intensity to generate images to achieve sub-wavelength resolution imaging near-field millimeter wave imaging system and method. According to exemplary embodiments of the present invention, a near-field imaging system can operate in the frequency range of about 65 GHz and greater (eg, about 110 GHz or greater), while achieving sub-wavelength resolution orders of magnitude higher than diffraction limited.

[0030] far field and near field

[0031] The resolution of a far-field antenna can be calculated from its directivity. The directivity of the antenna D 0 It is defined as the ratio of the radiation intensity in a given direction from the antenna to the average radiation...

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Abstract

Systems and method for near-field millimeter wave imaging are provided, in particular, near-field millimeter wave imaging systems and methods that enable sub-wavelength resolution imaging by scanning objects with sub-wavelength probe elements and capturing and measuring phase and intensity of reflected energy to generate images.

Description

[0001] Cross References to Related Applications [0002] This application claims the benefit of priority to US Provisional Patent Application Serial No. 61 / 513,138, filed July 29, 2011, the disclosure of which is hereby incorporated by reference in its entirety. technical field [0003] The present invention generally relates to providing systems and methods for near-field millimeter-wave imaging, and more particularly, the present invention relates to achieving an image by scanning an object using a sub-wavelength probe element and capturing and measuring the phase and intensity of the reflected energy. Near-field millimeter-wave imaging system and method for sub-wavelength resolution imaging. Background technique [0004] In general, conventional far-field mmWave imaging systems have been widely used in various applications such as security screening (eg, concealed weapons inspection), collision avoidance radar, and for safe landing in low-visibility conditions. These con...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01Q3/00
CPCG01S13/89H01Q1/2283H01Q7/00H01Q21/061
Inventor A·巴巴卡尼刘兑现S·K·雷诺兹M·A·桑度莱努
Owner INT BUSINESS MASCH CORP