Automated Test Platform for Embedded Devices

An automated testing and platform technology, applied in the direction of software testing/debugging, etc., can solve the problems of increased cost and poor versatility of automated testing, and achieve the effect of reducing burden, good data structure foundation, and convenient data statistics

Active Publication Date: 2017-10-03
XIAN ZHONGLANG AL TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The technical problem to be solved by the present invention is to provide a highly versatile automated testing platform for embedded devices in order to overcome the defects of the existing technology, such as the unavoidable increase in cost and the poor versatility of automated testing when there are many test cases

Method used

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  • Automated Test Platform for Embedded Devices
  • Automated Test Platform for Embedded Devices
  • Automated Test Platform for Embedded Devices

Examples

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Embodiment Construction

[0039] The present invention is further illustrated below by means of examples, but the present invention is not limited to the scope of the examples.

[0040] refer to figure 1 , the automated test platform for embedded devices according to the present invention includes a plurality of subsystems, and a holographic tree 6 is used to realize communication and data sharing among the plurality of subsystems. The holographic tree adopts the data structure of XML DOM, and the plurality of subsystems The system includes a script subsystem 1, an instrument subsystem 2, a user subsystem 3, a log subsystem 4 and a display subsystem 5, and the holographic tree 6 includes a script / log subtree, an instrument subtree, and a user subtree , wherein, the script subsystem 1 is used to execute test scripts, collect test results, generate original log nodes, and construct and maintain the script / log subtree according to test results;

[0041] The instrument subsystem 2 is used for maintaining ...

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Abstract

The invention discloses an automatic testing platform for embedded equipment, which includes a plurality of subsystems, among which a holographic tree is used to realize communication and data sharing, and the plurality of subsystems include a script subsystem and an instrument subsystem , a user subsystem, a log subsystem and a display subsystem, the script subsystem is used to execute test scripts, collect test results, generate original log nodes and build and maintain the script / log subtree according to test results; The instrument subsystem is used to maintain the instrument subtree and synchronize remote instrument information; the user subsystem is used to complete the construction and continuous update of the user subtree; the log subsystem is used to construct a log subtree independent of the script according to the script The pure log tree of the holographic tree; the display subsystem is used to read each subtree in the holographic tree to complete the construction of the interface of the corresponding subsystem. The platform created by the invention has good versatility in the field of routing and switching equipment testing.

Description

technical field [0001] The invention relates to an automatic test platform for embedded equipment, in particular to an automatic test platform for routing and switching equipment. Background technique [0002] The main challenges facing testing software today are: customers want more software features, faster delivery, cheaper cost, and at the same time, better software quality, if not more than their expectations, but at least meet deadline. [0003] This means that the software testing team has great responsibilities, and more functions mean that the software baseline for each test is larger and more complex. Therefore, for a product development, more test cases need to be delivered, but the "faster delivery speed" requirements, so that the test department does not have more time to complete all tests. In order to speed up the testing process, if more manpower is invested, such as increasing the number of testing engineers, it will inevitably increase the testing cost. ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/36
Inventor 张鑫
Owner XIAN ZHONGLANG AL TECH CO LTD
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