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Combined bracket for central test bench

A technology of combining brackets and test benches, applied in laboratory stools/laboratory benches, laboratory utensils, chemical instruments and methods, etc., can solve the problems of lower bracket strength, inconvenient electrical inspection and maintenance, etc., and achieve improved mechanical strength, Simple structure and the effect of improving stability

Active Publication Date: 2015-07-22
TIANCHANG GAOPENG EXPERIMENT EQUIP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The structure of the test bench support with the above structure is simple, but the hollow structure greatly reduces the strength of the support, and it is not convenient for electrical inspection and maintenance.

Method used

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  • Combined bracket for central test bench
  • Combined bracket for central test bench
  • Combined bracket for central test bench

Examples

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Embodiment Construction

[0016] like Figure 1-6 as shown, figure 1 It is a side view structural schematic diagram of a combined support for the central test bench proposed by the present invention; figure 2 It is a top view structural schematic diagram of a combined support for the central test bench proposed by the present invention; image 3 It is a schematic cross-sectional structure schematic diagram of a V-shaped base plate of a combined support for the central test bench proposed by the present invention; Figure 4 It is a structural schematic diagram of a combined support panel for the central test bench proposed by the present invention; Figure 5 It is a structural schematic diagram of the first connecting piece of a combined support for the central test bench proposed by the present invention; Image 6 It is a structural schematic diagram of the second connecting piece of the combined support for the central test bench proposed by the present invention.

[0017] refer to Figure 1-6 ,...

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Abstract

The invention discloses a combined bracket for a central test bench. The combined bracket comprises a bracket frame consisting of at least three V-shaped substrates, wherein a connecting plate is connected to the lower end of the bracket frame, and is fixed on a tabletop of the test bench; thread inlet holes are formed in the connecting plate; an end cap is arranged at the upper end of the bracket frame; any two adjacent V-shaped substrates are connected through a fastening screw; communicated threading holes are formed among the V-shaped substrates; each V-shaped substrate consists of left and right symmetrical side plates; a first inward edgefold is arranged at the tail end of each side plate; a second inward edgefold is arranged at the tail end of each first edgefold; a third inward edgefold is arranged at the tail end of each second edgefold; a fourth inward edgefold is arranged at the tail end of each third edgefold; panels and first connecting pieces are arranged at insertion holes in the fourth edgefolds; second connecting pieces are arranged at insertion holes in the first edgefolds. The combined bracket is simple in structure, convenient to mount and favorable for electrical repairing and maintenance in the bracket, the mechanical strength of the bracket is greatly strengthened, and the stability of a bracket platform is improved.

Description

technical field [0001] The invention relates to the technical field of central test benches, in particular to a combined support for central test benches. Background technique [0002] The central test bench is suitable to be placed in the middle of the laboratory and is the main platform for testing activities. The traditional central test bench is equipped with a test bench on the table. The test bench includes a plurality of brackets, and the brackets are connected by a platform arranged horizontally. The interface used to connect the platform, the platform can be installed according to the actual height needs to select the corresponding interface. In order to facilitate wiring, the bracket is designed as a hollow structure, and operating terminals such as lighting mechanisms and sockets are arranged on the surface of the bracket. [0003] The structure of the test bench support of the above structure is simple, but the strength of the support is greatly reduced due to ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): B01L9/02B01L9/00
Inventor 吴正高
Owner TIANCHANG GAOPENG EXPERIMENT EQUIP
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