RF Asymmetric Low Impedance Test Fixture

Abstract

The present invention relates to the technical field of radio-frequency microwave measurement, and particularly to a radio-frequency asymmetrical low-impedance test fixture. The test fixture comprises: a PCB board (7) and a bottom plate (9). The left side of the PCB board (7) is provided with a first impedance conversion unit (1), and the right side of the PCB board (7) is provided with a second impedance conversion unit (2). The first impedance conversion unit (1) and the second impedance conversion unit (2) are respectively composed of a group of gradually varied microstrip lines, wherein the widths of all microstrip lines of each group of microstrip lines are the same, and the lengths of each group of microstrip lines regularly change in order from small to big and then in order from big to small in the arrangement direction. The PCB board (7) is connected to the upper end of the bottom plate (9). The provided radio-frequency asymmetrical low-impedance test fixture can effectively increase the real part of the impedance of a transistor to be tested, solve the source problem of oscillation, and prevent a device to be tested from being burnt, thereby guaranteeing that the radio frequency and microwave performance of the device to be tested are fully played.

Description

technical field [0001] The invention relates to the technical field of radio frequency microwave measurement, in particular to a radio frequency asymmetric low impedance test fixture. Background technique [0002] At present, the 50Ω test fixture is usually used to test the large grid width and high power PA (Power Amplifier, power amplifier). The 50Ω test fixture is a symmetrical test fixture. The input and output impedances of the test equipment are not equal, so the input impedance and output impedance of the existing 50Ω test fixture after transformation cannot completely match the test of the tested equipment. The mismatch of input impedance will cause low-frequency oscillation and burn the device due to high power test. , the output impedance mismatch leads to inaccurate measurements. Contents of the invention [0003] The technical problem to be solved by the present invention is to provide a radio-frequency asymmetric low-impedance test fixture that can match the ...

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Problems solved by technology

[0002] At present, the 50Ω test fixture is usually used to test the large grid width and high power PA (Power Amplifier, power amplifier). The 50Ω test fixture is a symmetrical test fixture. The input and output impedances of the test equipment are not equal, so the input impedance and output impedance of the existing 50Ω test fixture after transformation cannot completely match the test of the tested equipment. The mismatch of input impedance will cause low-frequency oscillation and burn the device due to high power test. , output impedance mismatch leads to inaccurate measurements

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