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Direct-current offset calibration method and circuit for pipelined analog-to-digital converters

An analog-to-digital converter, DC offset technology, applied in the direction of analog/digital conversion calibration/testing, etc., can solve the problems of increasing circuit complexity, affecting the accuracy and speed of the analog-to-digital converter, and improving the dynamic range and effective number of digits. , the effect of reducing DC offset and increasing flexibility

Active Publication Date: 2014-07-02
BEIJING CEC HUADA ELECTRONIC DESIGN CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The existing method to eliminate the DC offset of the operational amplifier in the pipeline stage circuit is often to improve the timing or circuit structure of the analog circuit in the stage circuit. Although it can reduce the DC offset, it will increase the complexity of the circuit and introduce new parasitics, thereby affecting the accuracy and speed of the ADC to some extent

Method used

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  • Direct-current offset calibration method and circuit for pipelined analog-to-digital converters
  • Direct-current offset calibration method and circuit for pipelined analog-to-digital converters
  • Direct-current offset calibration method and circuit for pipelined analog-to-digital converters

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Embodiment Construction

The specific embodiments of the present invention will be described below in conjunction with the accompanying drawings.

See Figure 8 As shown, the pipeline ADC core circuit 100 is an existing DC offset core circuit of an operational amplifier, and the DC offset calibration circuit 200 is a DC offset calibration circuit proposed by the present invention for pipeline AD converters. The implementation circuit of the algorithm includes a logic control module 210 , a calculation and storage module 220 and an asynchronous subtractor module 230 .

The above-mentioned logic control module 210 adopts the same operating clock CLOCK as the core circuit of the pipeline analog-to-digital converter; the input signal connected to it includes the calibration start enable signal START, and the calibration reset enable signal RESET; the output signal connected to it includes , calculation and storage enable signal ENABLE, analog-to-digital converter sampling switch control signal Input Short...

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PUM

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Abstract

The invention provides a direct-current offset calibration method and an implementation circuit thereof for pipelined analog-to-digital converters. The calibration method comprises the following main steps: step 1, analog inputs VIP and VIN of a pipelined analog-to-digital converter are connected with an input common-mode voltage VCM; step 2, digital output of a core circuit of the analog-to-digital converter is sampled every X clock cycles, sampling is repeated for Y times, and an average value is taken and written into a memory module, wherein X and Y are integers and values thereof can be selected as required by calibration time and calibration precision; step 3, the analog inputs VIP and VIN of the analog-to-digital converter are connected with an input signal, and the analog-to-digital converter enters a normal working state; and step 4, subtraction is performed between the direct-current offset average value written into the memory module and digital output of the core circuit in a normal working state to finally obtain digital output with direct-current offset calibration. Direct-current offset of pipelined analog-to-digital converters can be reduced, and the dynamic range of analog-to-digital converters is increased.

Description

technical field [0001] The invention proposes a DC offset calibration method and a realization circuit for an analog-to-digital converter with pipeline structure. Background technique [0002] See figure 1 and figure 2 As shown, it is an existing common pipeline analog-to-digital converter stage circuit, each stage is 1.5 bits, controlled by two-phase non-overlapping clocks, and works alternately in the sampling phase and the holding phase. Among them, C1 and C2 are sampling capacitors with equal capacitance values, 110 is an operational amplifier, VIN is the input voltage of the stage circuit, VOUT is the output voltage of the stage circuit, b=-1 or 0 or +1, and VREF is the value of the stage circuit for subtraction reference voltage. Ideally, at the end of the sampling phase, the total charge stored on capacitors C1 and C2 is Q1=VIN*C1+VIN*C2=2*VIN*C1; at the end of the hold phase, the total charge stored on capacitors C1 and C2 Q2=b*VREF*C2+VOUT*C1=(VOUT+b*VREF)*C1. ...

Claims

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Application Information

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IPC IPC(8): H03M1/10
Inventor 郭丹丹李罗生
Owner BEIJING CEC HUADA ELECTRONIC DESIGN CO LTD
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