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Method for generating function summary information related to temporal security attribute defect modes

A technology of security attributes and defect patterns, which is applied in the field of generating function summary information related to time-series security attributes and defect patterns, and can solve problems affecting analysis efficiency and complex function call relationships

Active Publication Date: 2014-07-09
BEIJING UNIV OF POSTS & TELECOMM
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Problems solved by technology

[0004] After studying several existing pattern-matching-based static analysis tools for code defects, we found that in the process of static code defect analysis of C program codes, especially when detecting timing security attribute defect patterns, it is often necessary to deal with complex The function call relationship
The traditional method is similar to function inlining, which analyzes the called function layer by layer at the function call point, but this will seriously affect the analysis efficiency

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  • Method for generating function summary information related to temporal security attribute defect modes
  • Method for generating function summary information related to temporal security attribute defect modes
  • Method for generating function summary information related to temporal security attribute defect modes

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Embodiment Construction

[0037] Embodiments of the present invention will be described in detail below with reference to the accompanying drawings.

[0038] The present invention proposes a method for generating the function summary information related to the time-series security attribute class defect mode, such as figure 1 shown, including the following steps:

[0039] S101 Determine the defect mode of the time-series security attribute class in the program under test, and generate a description file of the defect mode of the time-series security attribute class;

[0040] S102 Obtain the finite automatic state machine of the time-series security attribute defect mode according to the description file;

[0041] S103 Generate function summary information for the functions in the program under test according to the finite automatic state machine.

[0042] Preferably, after generating function summary information for the functions in the program under test according to the finite automatic state machi...

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Abstract

The invention relates to a method for generating function summary information related to temporal security attribute defect modes. The method includes judging the temporal security attribute defect modes of detected programs and generating description files of the temporal security attribute defect modes; acquiring finite automatic state machines of the temporal security attribute defect modes according to the description files; generating the function summary information for functions in the detected programs according the finite automatic state machines. The method has the advantages that the function summary information can be generated for the functions in the detected programs according to the finite automatic state machines for describing the temporal security attribute defect modes, static tests can be carried out on software by the aid of the function summary information, and accordingly the software static defect detection efficiency can be improved.

Description

technical field [0001] The invention relates to the technical field of software static testing, in particular to a method for generating function summary information related to time series security attribute defect modes. Background technique [0002] Static code defect analysis technology speculates the behavior of the program at runtime through static analysis of the code, so as to find possible defects in the code. Such techniques mainly include abstract interpretation, theorem proving, model checking, symbolic execution, and code inspection based on defect patterns. [0003] The code defect finding method based on pattern matching mainly includes the following two steps: first, summarize the defects that have occurred in the existing code and extract "defect pattern knowledge"; Defect pattern matching" to determine whether the inspected code contains the corresponding defect, and present the matching result to the user in the form of a defect detection report. [0004]...

Claims

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Application Information

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IPC IPC(8): G06F11/36
Inventor 金大海王前宫云战黄俊飞王雅文
Owner BEIJING UNIV OF POSTS & TELECOMM