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Scintillator array, and X-ray detector and X-ray examination device using scintillator array

A scintillator array and scintillator technology, which are applied in the field of scintillator arrays and can solve problems such as reduced reflection efficiency of an adhesive layer

Active Publication Date: 2014-07-30
KK TOSHIBA +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Titanium oxide in the form of fine powder tends to aggregate in the adhesive layer, thereby reducing the reflection efficiency of the adhesive layer

Method used

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  • Scintillator array, and X-ray detector and X-ray examination device using scintillator array
  • Scintillator array, and X-ray detector and X-ray examination device using scintillator array
  • Scintillator array, and X-ray detector and X-ray examination device using scintillator array

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0063] As reflective particles, titanium oxide (TiO 2 )powder. Titanium oxide powder has a particle size distribution with a peak at 0.22 μm. The titanium oxide powder was mixed with an epoxy resin as a transparent resin after pulverizing aggregates with an ultrasonic vibrator. The mixing step of the titanium oxide powder and the epoxy resin was implemented using a three-roll mixer. The mixing time of the three roll mixer was set to 20 hours. The viscosity of the mixture (resin mixture) of titanium oxide powder and epoxy resin was set to 2 Pa·s.

[0064] Next, gadolinium oxysulfide (Gd 2 o 2S: A scintillator module formed of a sintered body of Pr). The scintillator block was obtained by grinding|polishing so that the surface roughness (Ra) might become 1 micrometer. The interval between adjacent scintillator modules was uniformly set to 80 μm, and the scintillator modules were arranged so that there were 64 scintillator modules in the long side direction and 24 scintill...

Embodiment 2～5

[0066] A scintillator array was produced in the same manner as in Example 1, except that reflective particles having the average particle diameter and material shown in Table 1 were used.

Embodiment 6

[0083] As reflective particles, titanium oxide (TiO 2 )powder. Titanium oxide powder has a particle size distribution with a peak at 0.28 μm. The titanium oxide powder was mixed with an epoxy resin as a transparent resin after pulverizing aggregates with an ultrasonic vibrator. The mixing step of the titanium oxide powder and the epoxy resin was implemented using a three-roll mixer. The mixing time of the three roll mixer was set to 25 hours. The viscosity of the mixture (resin mixture) of titanium oxide powder and epoxy resin was set to 1.8 Pa·s.

[0084] Next, aluminum garnet ((Gd 0.49 Tb 0.20 Lu 0.30 Ce 0.01 ) 3 (Al 0.6 Ga 0.4 ) 5 o 12 ) The scintillator module formed by the sintered body. The scintillator block was obtained by grinding|polishing so that the surface roughness (Ra) might become 1 micrometer. The interval between adjacent scintillator modules was uniformly set to 80 μm, and the scintillator modules were arranged so that there were 64 scintillato...

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Abstract

A scintillator (1) according to an embodiment is provided with a plurality of scintillator blocks (2) and a reflecting layer part (3) interposed between adjacent scintillator blocks (2). The scintillator blocks (2) are integrated by the reflecting layer part (3). The reflecting layer part (3) has reflective particles dispersed in a transparent resin. The reflective particles include titanium oxide particles and / or tantalum oxide particles and have a mean particle diameter of less than or equal to 2 [mu]m. The number of reflective particles per 5 [mu]m * 5 [mu]m unit area of the reflective layer part (3) is in the range of 100 to 250 particles inclusive.

Description

technical field [0001] Embodiments of the present invention relate to a scintillator array, an X-ray detector using the scintillator array, and an X-ray inspection apparatus. Background technique [0002] In the fields of medical diagnosis and industrial non-destructive inspection, X-ray inspection devices such as X-ray tomographic imaging devices (X-ray CT devices) are used. The X-ray CT apparatus has an X-ray tube (X-ray source) for irradiating a fan-shaped fan-beam X-ray and an X-ray detector in which many X-ray detection elements are arranged side by side, facing the tomographic plane of the subject. structure. In an X-ray CT apparatus, a subject is irradiated with fan-beam X-rays from an X-ray tube, and X-ray absorption data transmitted through the subject are collected by an X-ray detector. The X-ray absorption data collected by the X-ray detector is analyzed by a computer. Specifically, calculation of the X-ray absorptivity at each position of the tomographic plane...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01T1/20
CPCG01T1/2002G01N23/046G01T1/2006
Inventor 森本一光齐藤昭久足达祥卓丰岛正规小柳津英二
Owner KK TOSHIBA
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