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Method for Determination of α Coefficient in X-ray Fluorescence Analysis

A technology of fluorescence analysis and measurement method, which is applied in the field of X-ray fluorescence analysis, and can solve problems such as error and limitation of correction effect

Active Publication Date: 2016-05-18
CHINA TEST & CERTIFICATION INT GRP CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to the error of the parameters involved in the calculation process of the theoretical α coefficient, the correction effect is limited to a certain extent

Method used

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  • Method for Determination of α Coefficient in X-ray Fluorescence Analysis
  • Method for Determination of α Coefficient in X-ray Fluorescence Analysis
  • Method for Determination of α Coefficient in X-ray Fluorescence Analysis

Examples

Experimental program
Comparison scheme
Effect test

example 1

[0099] Influence coefficient α of ferric oxide in cement on silica SiO2,Fe2O3 determination

[0100] Select a standard sample S, the chemical composition of the sample is shown in Table 1:

[0101] Table 1

[0102] ingredients

Fe 2 o 3

SiO 2

percentage (%)

3.30

21.45

[0103] Will (1-y SiO2 ) standard samples S and y SiO2 Parts base silica SiO 2 Mixing to prepare 19 mixed samples S ySiO2 ,y SiO2 The values ​​are shown in the second column of Table 2; the silica mass fraction C of the corresponding sample is calculated according to formula (14) SiO2 See the third row of table 2, after these 19 samples are prepared into glass frit, to the X-ray fluorescence intensity I of silicon composition of glass frit SiO2 The measurement results are shown in column 4 of Table 2, and column 5 of Table 2 is the product of the values ​​in column 2 and column 4.

[0104] Will (1-y Fe2O3 ) standard samples S and y Fe2O3 part base Fe 2 o 3 Mi...

example 2

[0127] Example 2: Calculation of the coefficient of silica to ferric oxide in cement

[0128] Use the glass frit prepared in Example 1 to measure the X-ray fluorescence intensity of the iron component in the frit. At this time, the standard samples of the ferric oxide series are the P series, and the silicon dioxide series standard samples are the Q series. Therefore, the The mass fraction of iron oxide in the ferrous series is calculated by formula (14), and the concentration calculation results and corresponding strength measurement results are shown in Table 4; the mass fraction of ferric oxide in the silicon dioxide series is calculated by formula (16), and the concentration calculation results See Table 5 for the corresponding strength results.

[0129] Table 4:

[0130] sample name

y Fe2O3

C Fe2O3

I Fe2O3

I*y Fe2O3

Sy Fe2O3,1

0.004217

3.71

131.821627

0.55593533

Sy Fe2O3,2

0.008658

4.14

147.252383 ...

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Abstract

The invention discloses an alpha coefficient determination method of X ray fluorescence analysis. The alpha coefficient determination method comprises selecting a standard sample S at least containing a component P and a component Q, preparing n standard samples belonging to a P series, preparing m standard samples belonging to a Q series, preparing glass fuse pieces from the standard samples belonging to the P series, then respectively carrying out measurement of X ray fluorescence intensity, calculating K1, K2, K3 and K4 by a formula of K=(XTX)-1XTC, and calculating an alpha coefficient of the component Q to the component P by a formula of alpha p, q=(K1*K4-K2*K3) / (K1*K3+K2*K3). The alpha coefficient determination method of X ray fluorescence analysis can be used in detection of a cement sample.

Description

technical field [0001] The invention relates to an X-ray fluorescence analysis technology, in particular to a method for measuring alpha coefficient of X-ray fluorescence analysis. Background technique [0002] At present, the α coefficient used in X-ray fluorescence analysis is generally a theoretical α coefficient, or an empirical correction coefficient determined by linear regression experiments. The empirical correction coefficient does not have a clear physical meaning. The experimental determination of the α coefficient with clear physical meaning is limited to the binary system, which is mainly used for comparison with the theoretical α coefficient, and generally will not be applied to the actual XRF analysis work. Due to the error of the parameters involved in the calculation process of the theoretical α coefficient, the correction effect is limited to a certain extent. Contents of the invention [0003] The main purpose of the present invention is to provide a me...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/223
Inventor 马振珠刘玉兵戴平诸葛顺金赵鹰立闫冉韩蔚
Owner CHINA TEST & CERTIFICATION INT GRP CO LTD