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Calibration method for digital multimeter

A technology of digital multimeter and calibration method, which is applied in the direction of measuring devices, instruments, and measuring electrical variables, etc., which can solve the problems of measurement result deviation, interference, and insufficient resistance precision, and achieve the effect of eliminating random errors and improving accuracy

Inactive Publication Date: 2014-08-06
UNIV OF ELECTRONIC SCI & TECH OF CHINA
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] 2. The precision of the resistance in the peripheral circuit of the chip is not high enough, and there is a certain temperature drift;
[0005] 3. Noise and interference in the hardware circuit
[0006] Therefore, if the error existing in the digital multimeter is not processed and provided to the user, it will cause too much deviation in the measurement result, which will directly affect the performance of the digital multimeter, let alone meet the measurement needs of the user.

Method used

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  • Calibration method for digital multimeter
  • Calibration method for digital multimeter
  • Calibration method for digital multimeter

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Embodiment

[0024] figure 1 It is a flow chart of a specific embodiment of the calibration method of the digital multimeter of the present invention. Such as figure 1 Shown, the calibration method of digital multimeter of the present invention comprises the following steps:

[0025] S101: Select the range, short or open the digital multimeter according to the selected measurement function to get the current zero bias value β. Among them, the zero bias value test method of resistance measurement and voltage measurement is to short the test leads, and the zero bias value measurement method of current measurement is to disconnect the test leads.

[0026] S102: Range segmentation: record the current range as R, divide the range into N+1 segments, and set the split point R n , where n represents the serial number of the segmentation point, and the value range is n=1, 2,..., N, where N represents the number of segmentation points.

[0027] The following uses the 400Ω range of resistance as ...

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Abstract

The invention discloses a calibration method for a digital multimeter. The measuring range is segmented, a corresponding calibration coefficient is worked out through a measured value and a standard value of a standard workpiece to be measured corresponding to N segmentation points Rn, and a zero offset value, a measured value of an unknown workpiece to be measured is modified through the calibration coefficient, and the applicable range of the calibration coefficient is determined according to the segmentation points Rn. Through the calibration method for the digital multimeter, the precision of the digital multimeter can be improved. Measured values in the region nearby the segmentation points of the applicable range of the calibration coefficient can be modified with the linear spline interpolation method, and the precision is further improved. Besides, the measured values can be processed in advance through average smoothing filtering, and therefore random errors are eliminated.

Description

technical field [0001] The invention belongs to the technical field of digital multimeters, and more specifically relates to a calibration method for digital multimeters. Background technique [0002] A digital multimeter is a multipurpose electronic measuring instrument, belonging to the technical field of electronic measurement. Only by ensuring the high precision of the measuring instrument itself can the instrument user be provided with reliable test data. However, the digital multimeter will produce some unavoidable errors in its own hardware design. The main sources of errors are: [0003] 1. Measure the error generated by the internal circuit of the chip; [0004] 2. The precision of the resistance in the peripheral circuit of the chip is not high enough, and there is a certain temperature drift; [0005] 3. Noise and interference in the hardware circuit. [0006] Therefore, if the errors existing in the digital multimeter are not dealt with before being provided ...

Claims

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Application Information

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IPC IPC(8): G01R35/00
Inventor 马敏戴志坚王锂董婵娟
Owner UNIV OF ELECTRONIC SCI & TECH OF CHINA
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