Mean free error time assessment method and system based on irradiation test satellite-borne responder

Abstract

The invention discloses a mean free error time assessment method and system based on an irradiation test satellite-borne responder. The method includes the following steps that (1) the particle variety of an irradiation test is selected according to orbit space environment of the satellite-borne responder arranged in a satellite; (2) particle beams of selected particles are transmitted, a timer is started, and a remote control function module, a remote measurement function module and a distance measurement function module are monitored in real time; (3) when it is monitored that output information of any of the remote control function module, the remote measurement function module and the distance measurement function module is matched with set error code information, the timer is stopped, and the particle beams are stopped from being transmitted; (4) particle fluence and the function flipping rate are calculated, so that ratio information is obtained; (5) the mean free error time is calculated according to the ratio information and bit flipping rate information of the satellite-borne responder in the corresponding orbit space environment.

Description

technical field [0001] The invention relates to the technical field of aerospace measurement and control, in particular to a method and system for evaluating mean time between failures of spaceborne transponders based on radiation tests. Background technique [0002] In recent years, large-scale integrated circuits have been widely used in the aerospace field due to their high density, high performance, low cost and reconfigurable characteristics. From the perspective of application, even the radiation-resistant hardened version of FPGA (Field-programmable gate array, field programmable gate array) is still very sensitive to SEE (Single Event Effect, single event effect), and the industry generally recognizes that space radiation It is the main obstacle for the application of SRAM FPGA in space. [0003] The average time between failures of a single machine is an important indicator for evaluating the reliability of transponders. Generally speaking, it is analyzed through t...

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Problems solved by technology

[0003] The average time between failures of a single machine is an important indicator for evaluating the reliability of transponders. Generally speaking, it is analyzed through the component stress analysis method, and it is evaluated through a large number of normal temperature and high and low temperature aging times on the ground. The above method is carried out on the ground. The impact of space radiation is not considered, so there is a difference from the real application of a stand-alone machine in a space environment

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