Eureka AIR delivers breakthrough ideas for toughest innovation challenges, trusted by R&D personnel around the world.

Testing data compression and decompression method based on secondary exclusive-or operation

A test data and decompression technology, applied in the direction of electrical components, code conversion, etc., can solve the problems of increasing the shortest length and reducing the number of divisions, achieving the effect of improving the compression ratio, improving the hardware overhead ratio, and increasing the shortest run length

Inactive Publication Date: 2014-09-10
ANQING NORMAL UNIV
View PDF2 Cites 14 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Two questions are: (1) Can the number of divisions be further reduced, and (2) Can the minimum length of divisions be further increased

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Testing data compression and decompression method based on secondary exclusive-or operation
  • Testing data compression and decompression method based on secondary exclusive-or operation
  • Testing data compression and decompression method based on secondary exclusive-or operation

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0057] The present invention will be further described below in conjunction with the accompanying drawings.

[0058] definition:

[0059] A run of 0s refers to a string consisting of several consecutive 0s and ending with a 1, the number of 0s is at least 1, and the length L of the run of 0s refers to the number of 0s in the string.

[0060] A run of 1 refers to a string consisting of several consecutive 1s and ending with a 0, the number of 1s is at least 1, and the length L of the run of 1 refers to the number of 1s in the string.

[0061] The 01 sequence refers to a string sequence that starts at 0 and alternates with 0 / 1 and ends with the same last two digits; the length L of the 01 sequence refers to the length of the string excluding the last digit;

[0062] From the above definition of the 01 sequence, if the length L of the 01 sequence is an even number, its end must be two 1s, such as 01011, 0101011; if the length L of the 01 sequence is an odd number, its end must b...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a testing data compression and decompression method based on secondary exclusive-or operation, and the testing data compression and decompression method can reduce the partition number and increase the shortest run length so as to further improve the compression rate. The method provided by the invention can reduce the partition number and increase the shortest run length so as to further improve the compression rate by combining consecutive 01 or 10 sequences into a codeword by ortho-position exclusive-or. Through the decoding analysis, additional hardware overhead of a decoding structure of the method is less, and the method is independent of a circuit being tested, so that the method has excellent ratio of compression rate to hardware overhead.

Description

technical field [0001] The invention relates to an integrated circuit test method, in particular to a method for compressing and decompressing integrated circuit test data. Background technique [0002] Due to the rapid development of integrated circuit technology, the function of the system chip is becoming more and more powerful, but at the same time, the amount of test data used to test the chip is also increasing rapidly. The rapid increase in the amount of test data puts forward higher requirements on the storage space and transmission channel performance of expensive automatic test equipment ATE, and also increases the time required for testing chips and increases the cost required for testing. [0003] Test data compression technology is a very effective method to alleviate the excessive amount of test data. Scholars at home and abroad have conducted sufficient research on it. Test data encoding methods are a large category of test data compression techniques. The ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H03M7/30
Inventor 程一飞吴琼詹文法吴海峰朱世娟
Owner ANQING NORMAL UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com