Testing data compression and decompression method based on secondary exclusive-or operation

A test data and decompression technology, applied in the direction of electrical components, code conversion, etc., can solve the problems of increasing the shortest length and reducing the number of divisions, achieving the effect of improving the compression ratio, improving the hardware overhead ratio, and increasing the shortest run length

Inactive Publication Date: 2014-09-10
ANQING NORMAL UNIV
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  • Abstract
  • Description
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Problems solved by technology

Two questions are: (1) Can the number of divisions be further reduced, and (2) Can the minimum length of divisions be further increased

Method used

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  • Testing data compression and decompression method based on secondary exclusive-or operation
  • Testing data compression and decompression method based on secondary exclusive-or operation
  • Testing data compression and decompression method based on secondary exclusive-or operation

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Embodiment Construction

[0057] The present invention will be further described below in conjunction with the accompanying drawings.

[0058] definition:

[0059] A run of 0s refers to a string consisting of several consecutive 0s and ending with a 1, the number of 0s is at least 1, and the length L of the run of 0s refers to the number of 0s in the string.

[0060] A run of 1 refers to a string consisting of several consecutive 1s and ending with a 0, the number of 1s is at least 1, and the length L of the run of 1 refers to the number of 1s in the string.

[0061] The 01 sequence refers to a string sequence that starts at 0 and alternates with 0 / 1 and ends with the same last two digits; the length L of the 01 sequence refers to the length of the string excluding the last digit;

[0062] From the above definition of the 01 sequence, if the length L of the 01 sequence is an even number, its end must be two 1s, such as 01011, 0101011; if the length L of the 01 sequence is an odd number, its end must b...

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Abstract

The invention provides a testing data compression and decompression method based on secondary exclusive-or operation, and the testing data compression and decompression method can reduce the partition number and increase the shortest run length so as to further improve the compression rate. The method provided by the invention can reduce the partition number and increase the shortest run length so as to further improve the compression rate by combining consecutive 01 or 10 sequences into a codeword by ortho-position exclusive-or. Through the decoding analysis, additional hardware overhead of a decoding structure of the method is less, and the method is independent of a circuit being tested, so that the method has excellent ratio of compression rate to hardware overhead.

Description

technical field [0001] The invention relates to an integrated circuit test method, in particular to a method for compressing and decompressing integrated circuit test data. Background technique [0002] Due to the rapid development of integrated circuit technology, the function of the system chip is becoming more and more powerful, but at the same time, the amount of test data used to test the chip is also increasing rapidly. The rapid increase in the amount of test data puts forward higher requirements on the storage space and transmission channel performance of expensive automatic test equipment ATE, and also increases the time required for testing chips and increases the cost required for testing. [0003] Test data compression technology is a very effective method to alleviate the excessive amount of test data. Scholars at home and abroad have conducted sufficient research on it. Test data encoding methods are a large category of test data compression techniques. The ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H03M7/30
Inventor 程一飞吴琼詹文法吴海峰朱世娟
Owner ANQING NORMAL UNIV
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