tofd test block multi-channel sequential automatic scanning mechanism

Abstract

The invention relates to a TOFD test block multi-channel sequential automatic scanning mechanism, which includes a first probe group arranged on a scanning rack, and is characterized in that at least one second probe group is also arranged on the scanning rack The second probe group is arranged on the fixed seat, the fixed seat is arranged on the connecting rod, the connecting rod is arranged on the connecting seat to move up and down, the spring is sleeved on the connecting rod, and the two ends of the spring respectively resist On the fixed base and the connecting base; the connecting base is connected to the scanning frame; the connecting base is also pivotally connected with a shift fork; wherein the first fork of the shift fork is connected with one end of the pull piece, and the pull The other end of the sheet is connected to the fixed seat; the lower end of the second fork of the shift fork is lower than the upper surface of the test block; one end of the tension spring is connected to the first fork, and the other end of the tension spring is connected to the on the connecting seat. The invention effectively solves the problem that the test block with a large thickness needs to be scanned multiple times and the data is incomplete due to the collision between the probe group, the roller and the test block during the scanning process.

Description

technical field [0001] The invention relates to the field of ultrasonic detection, in particular to a TOFD multi-channel sequential automatic scanning mechanism. Background technique [0002] TOFD technology is a detection technology based on diffraction signals. It uses the principle that waves continue to propagate through scattering after encountering obstacles or small holes. Two wide-band narrow pulse probes are used for detection. Center line symmetrical arrangement. The unfocused longitudinal wave beam generated by the transmitting probe is incident on the inspected workpiece at a certain angle, part of the beam propagates along the near surface and is received by the receiving probe, and part of the beam is reflected by the bottom surface and then received by the receiving probe. The receiving probe determines the position and height of the defect by receiving the diffraction signal from the tip of the defect and its time difference. TOFD technology has many advant...

AI Technical Summary

Problems solved by technology

There is still a phenomenon of heavy workload and accidental factors affecting the scanning results

At the same time, none of the above-mentioned existing test block scanning devices can solve the problem of incomplete data caused by the collision between the probe group, rollers, etc. and the test block during one scan of the test block.

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