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Systems and methods for obtaining images with offsets for enhanced edge resolution

An image and edge technology, applied in the field of machine vision inspection systems, can solve the problems of precision inspection tolerance incompatible vibration, non-repeatability, complexity, etc.

Active Publication Date: 2017-04-12
MITUTOYO CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, this approach is mechanically complex and may introduce vibration and / or non-repeatability that are incompatible with tight detection tolerances

Method used

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  • Systems and methods for obtaining images with offsets for enhanced edge resolution
  • Systems and methods for obtaining images with offsets for enhanced edge resolution
  • Systems and methods for obtaining images with offsets for enhanced edge resolution

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Embodiment Construction

[0021]Several embodiments of the invention are described below. The following description provides specific details for a thorough understanding and enabling description of these embodiments. However, it will be understood by those skilled in the art that the present invention may be practiced without these numerous details. Also, some well-known structures or functions may not be shown or described in detail to avoid unnecessarily obscuring the related description of the various embodiments. The terms used in the description presented below are intended to be interpreted in their broadest reasonable manner, even when used in conjunction with a detailed description of certain specific embodiments of the invention.

[0022] figure 1 is a block diagram of an exemplary machine vision inspection system 10 that may be used in accordance with the methods described herein. The machine vision inspection system 10 includes a vision measurement machine 12 operatively connected to exc...

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Abstract

A method for obtaining two images of a workpiece with a desired sub-pixel offset between them in a machine vision inspection system. The image is obtained by operating the camera in the fast multi-image acquisition mode of the machine vision inspection system. In various embodiments, the method includes removing offsets between the images so that the artifacts are identical in the images, and combining the identical image data. The combined image has a higher resolution than the camera itself, which is acquiring the image in the machine vision inspection system, allows. The method can be implemented in an edge feature video tool that measures edge features on a workpiece. The direction of motion used to obtain the two images can be made to traverse the edge direction of the edge being measured.

Description

technical field [0001] The present invention relates to systems and methods for acquiring images, and more particularly to machine vision inspection systems and methods for acquiring multiple images to be used for measuring operations on workpieces. Background technique [0002] Precision machine vision inspection systems (or simply "vision systems") can be used to obtain precise dimensional measurements of inspected objects, and to inspect a variety of other object characteristics. Such a system may include a computer, camera and optics, and a precision stage movable in multiple directions to allow the camera to scan features of the workpiece being inspected. An exemplary commercially available prior art system is QUICK available from Mitutoyo America Corporation (MAC) located in Aurora IL. PC-based vision system family and software. QUICK is generally described in, for example, the QVPAK 3D CNC Vision Measuring Machine User Guide, published January 2003, and the QVPAK...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/00G06T7/00
CPCG01N21/8851G06T3/4069G01B11/02G01B2210/52G01N21/8803
Inventor P·G·格拉德尼克
Owner MITUTOYO CORP