Measuring device and method for automatic test equipment

Abstract

The invention relates to a measurement apparatus and method of automatic test equipment. The measurement apparatus comprises multiple pin parameter measurement units, an analog-to-digital converter and a control unit, wherein each pin parameter measurement unit is used for measuring a pin to be measured to generate a measurement signal; the analog-to-digital converter is used for converting the measurement signal to a value reading signal; and the control unit is electrically connected with the analog-to-digital converter for selecting one from the multiple pin parameter measurement units and controlling the analog-to-digital converter for conversion so as to receive the value reading signals, such that multiple pins to be measured can be measured rapidly, and the purpose of shortening test time is achieved.

Description

technical field [0001] The present invention relates to a measuring device and method, in particular to a measuring device and method for automatic testing equipment. Background technique [0002] In the manufacturing process of all electronic devices (Device), there is a need to remove the false and preserve the true, and this need is actually a testing process. Realizing this process requires various test equipment, such equipment is the so-called automatic test equipment (Automatic Test Equipment, ATE). In the field of automatic testing, how to shorten the test time has always been a very important issue, and shortening the test time means reducing the cost of the product. [0003] see figure 1 , which is a circuit diagram of a known art automatic test equipment. As shown in the figure, the known automatic test equipment includes a plurality of test channels CH1, CH2...CHn-1, CHn, and the multiple test channels CH1, CH2...CHn-1, CHn are connected to a parameter measure...

AI Technical Summary

Problems solved by technology

Therefore, the use of known automatic test equipment cannot achieve both accurate and fast measurement methods

[0005] Furthermore, usually when the automatic test equipment measures the test channel, a host sends measurement instructions to the automatic test equipment through a bus. When it is necessary to measure multiple test channels or to measure different components of the DUT at the same time , before testing each test channel, the host must issue a command to close all the channels, and then issue an command to open to open the test channels to be measured. Therefore, the more test channels or components to be measured, the more measurement commands must be issued. Therefore, when the above software control method is used to measure many test channels or components, the measurement speed will be too slow, and the above method will occupy too many resources of the bus

[0006] In addition, since the cost of the parameter measurement unit PMU is relatively high, if the number of parameter measurement units PMU is increased, the cost of the overall automatic measurement equipment will be increased

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