Optical gas chamber and method for calculating total optical distance by gas chamber

Abstract

The invention provides an optical gas chamber and a method for calculating the total optical distance by the gas chamber, relating to the field of measurement on gas components by a light ray analyzer. The optical gas chamber comprises a gas chamber cavity module and a plane reflection module, wherein the plane reflection module forms a square structure with openings in two ends, the adjacent side surfaces of the square structure are mutually vertical, the square structure is fixed by the gas chamber cavity module which provides to-be-tested gas, a coordinate system is selected according to the shape of the gas chamber structure, and the total optical distance is calculated. The optical gas chamber is simple in structure; the total optical distance of light rays in gas can be effectively obtained by matching with a calculating method, the maximization of light paths in a small space is realized, and the problem of interference caused by overlapping of the light paths can be reduced.

Description

technical field [0001] The invention relates to the field of gas composition measurement by a light analyzer. Background technique [0002] At present, the gas chambers used in infrared analyzers mainly include straight-through gas chambers and multi-reflection gas chambers. The gas concentration can be detected by using the absorption or scattering of light by the gas; the straight-through gas chamber has a simple structure, The volume of the gas chamber is small and the reaction speed is fast. It is a commonly used method for high-concentration gas analysis in industry. However, the straight-through gas chamber is limited by the size of the standard case, so that the optical path does not exceed 20mm, so the straight-through gas chamber is limited to the measurement of high-concentration gases. The principle of reflection increases the optical path, thereby increasing the optical depth, but due to the structure of the air chamber, the optical path of the existing multiple...

AI Technical Summary

Problems solved by technology

Therefore, a high-precision detection instrument means that the size of the gas chamber is larger and the volume is larger, which also means that such a gas chamber design cannot be made small and portable.

Patent No. 200820123271.6 discloses a multi-reflection gas chamber, which utilizes the principle of multiple reflections to measure in a narrow space. In the middle, the optical path generally overlaps multiple times at the waist of the pool, and the overlap in this part will lead to measurement accuracy problems

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