Holographic measuring method of two-dimensional Jones matrix parameters and implementation device

Abstract

The invention discloses a holographic measuring method of two-dimensional Jones matrix parameters and an implementation device. The method comprises the following steps: two mutually irrelevant lasers are subjected to diffraction light splitting; two zero level diffraction light rays subjected to the light splitting are converted into linearly polarized light rays with the vibration directions being orthogonal, and the linearly polarized light rays irradiate a polarization-sensitive sample and penetrate through the sample to become object light waves containing the polarization information of the sample; meanwhile, smoothing is performed on the primary diffraction light rays of two light sources; the two primary diffraction light rays of the two light sources are respectively reserved and converted into linearly polarized light rays of which the vibration directions form angles of 45 degrees and minus degrees with the polarization directions of the zero level diffraction light rays; the four linearly polarized light rays are taken as reference light to interfere with the object light waves, so that a four-channel Jones matrix hologram containing amplitudes, phases and polarization information of the object light waves is formed; data processing is performed on the four-channel Jones matrix hologram to obtain the complex amplitude distribution of all four matrix elements of the two-dimensional Jones matrix of the polarization-sensitive sample. Through the holographic measuring method of the two-dimensional Jones matrix parameter and the implementation device, high measuring efficiency is realized as the complex amplitude spatial distribution of all the four parameters of the Jones matrix of the to-be-measured sample can be measured only through one step.

Description

technical field [0001] The invention relates to a holographic measurement method and implementation device of two-dimensional Jones matrix parameters. Background technique [0002] When a beam of light passes through a polarization-sensitive material, in addition to changes in amplitude and phase, its polarization state also changes. In general, the light field E passing through a polarization-sensitive material out and the incident light field E in The relationship between can be expressed as: [0003] E → out = T E → in or E x out E y out = ...

AI Technical Summary

Problems solved by technology

However, this technique is not suitable for dynamic research on polarization-sensitive samples, because the measurement of Jones matrix parameters using this technique requires four-step measurement, and the rotation of the input and output polarizers needs to be precisely controlled during the measurement process;

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