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Self-triggering stack stscr‑ldmos high voltage esd protection circuit

A high-voltage, stacked unit technology, applied in the electronic field, can solve the problems of low maintenance voltage, burnout devices, etc., and achieve the effect of protecting internal circuits and reducing the risk of latch-up effect

Active Publication Date: 2017-04-05
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, if STSCR is used as a high-voltage ESD protection device, the very low maintenance voltage of STSCR will cause it to be prone to latch-up (latch-up) effect when it is used as a power supply clamp. After the ESD discharge is completed, the power supply continues to discharge and eventually burns out. bad device

Method used

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  • Self-triggering stack stscr‑ldmos high voltage esd protection circuit
  • Self-triggering stack stscr‑ldmos high voltage esd protection circuit
  • Self-triggering stack stscr‑ldmos high voltage esd protection circuit

Examples

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Embodiment 1

[0033] image 3 A schematic structural diagram of a self-triggering stacked STSCR-LDMOS high-voltage ESD protection circuit provided in this embodiment. A high-voltage ESD protection circuit for self-triggering stacked STSCR-LDMOS, such as image 3 As shown, it includes a P-type substrate 301, a first high-voltage N-type well region 302, a second high-voltage N-type well region 303, a first P-type heavily doped region 306, a second P-type heavily doped region 308, a third P-type heavily doped region 310, fourth P-type heavily doped region 313, fifth P-type heavily doped region 314, sixth P-type heavily doped region 316, seventh P-type heavily doped region 318, eighth P-type heavily doped region P-type heavily doped region 321, ninth P-type heavily doped region 322, first N-type heavily doped region 307, second N-type heavily doped region 311, third N-type heavily doped region 315, fourth N-type heavily doped region 320, first resistor 312, second resistor 319, first field ox...

Embodiment 2

[0044] Such as Figure 7 As shown, in this embodiment, on the basis of Embodiment 1, the second resistor 319 is removed. The working principle of this embodiment is the same as that of Embodiment 1.

[0045] Embodiment 2 removes resistor 319, so that Q 3 All the current after the breakdown flows through the resistor 404, which can increase the turn-on speed of the STSCR-LDMOS.

[0046] Figure 5 The equivalent circuit diagram of the high-voltage ESD protection circuit of the self-triggering stacked STSCR-LDMOS provided by the present invention. The present invention can greatly increase the sustain voltage by stacking more STSCR-LDMOS stacked units 501, and more effectively prevent the occurrence of latch-up effect.

[0047] Figure 6The I-V curve simulation diagram of different STSCR-LDMOS stacking numbers is given. It can be seen from the figure that as the stacking number increases, the breakdown voltage increases from 70V to 80V, and the sustain voltage increases from...

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PUM

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Abstract

The invention provides a high-voltage ESD protection circuit of self-triggering stacked STSCR-LDMOS, belonging to the technical field of electronics. It includes N STSCR-LDMOS stacking units, the STSCR-LDMOS stacking unit includes a STSCR-LDMOS device and a resistor, where N≥2, and there are N+1 P-type heavily doped regions on the substrate as guard rings to ground . The circuit breaks down and triggers the stacked STSCR-LDMOS through the first STSCR-LDMOS, effectively increasing the sustain voltage without increasing the trigger voltage.

Description

technical field [0001] The invention belongs to the field of electronic technology, and in particular relates to the design technology of an electrostatic discharge (ESD) protection circuit for a semiconductor integrated circuit chip, especially a self-triggering stacked STSCR-LDMOS (embedded with a laterally diffused metal oxide semiconductor field Effect transistor LDMOS Substrate-TriggerSilicon Controlled Rectifier, referred to as STSCR-LDMOS) high-voltage ESD protection circuit. Background technique [0002] During chip production, packaging, testing, storage, and handling, electrostatic discharge (ElectroStatic Discharge, ESD for short) exists as an inevitable natural phenomenon. With the reduction of the feature size of integrated circuit technology and the development of various advanced technologies, it is more and more common for chips to be damaged by ESD phenomena. Relevant research and investigations have shown that 30% of integrated circuit failure products are ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L27/02
Inventor 乔明马金荣孙成春王裕如张波
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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