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A method for marking mineral elements

A technology of mineral elements and elements, which is applied in the field of automatic testing of process mineralogy, can solve the problems of complex internal implementation algorithms, reduce the efficiency of element identification and calibration, and achieve the effect of fast element labeling processing

Active Publication Date: 2017-06-20
BEIJING GENERAL RES INST OF MINING & METALLURGY
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0010] However, this kind of spectral analysis method, which includes qualitative analysis and quantitative analysis processing, has the disadvantage of complex internal implementation algorithm in the process of applying to energy spectrometer, which reduces the efficiency of element identification and calibration

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  • A method for marking mineral elements
  • A method for marking mineral elements
  • A method for marking mineral elements

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Embodiment Construction

[0042] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0043] In the process mineralogy automatic test system, the incident electron beam of the scanning electron microscope hits the sample mineral to excite the characteristic X-rays which are received by the energy spectrometer to form the energy spectrum of the sample mineral (that is, the energy spectrum line of the mineral) , for the energy spectrum data obtained by the energy spectrometer, when using the manual identification energy spectrum data i...

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Abstract

The invention discloses a method for marking mineral elements. The method comprises the following steps: firstly, judging whether the elements exist or not in positions which represent peak positions of the elements in energy spectrum lines of mineral substances so as to determine the elements which possibly exist in the mineral substances; then, fitting the energy spectrum lines of the mineral substances by using characteristic spectrum lines of the elements which possibly exist by adopting the non-negative least-squares method, and determining the proportion of the elements which possibly exist in the mineral substances according to a fitting result; and finally, calculating and determining the significative degrees of the elements in positions which represent the peak positions according to the proportion of the elements which possibly exist in the mineral substances and judging whether the elements exist in the mineral substances or not according to the significative degrees so as to mark the mineral elements. Therefore, the mineral elements can be simply and efficiently marked, thereby further satisfying the requirements of an automatic testing system in process mineralogy.

Description

technical field [0001] The invention relates to an automatic test technology of process mineralogy, in particular to a method for marking mineral elements. Background technique [0002] In the process mineralogy automatic testing system, the incident electron beam of the scanning electron microscope hits the sample mineral to excite the characteristic X-rays that are received by the energy spectrometer to form the energy spectrum of the sample mineral, and the schematic diagram of the incident electron beam hitting the sample like figure 1 shown, where: [0003] Secondary electrons: are electrons outside the sample nucleus that are bombarded by incident electrons. A region in the range of 5-50nm is generated with lower energies, around 50ev. [0004] Backscattered electrons: A portion of incident electrons that are reflected back by atoms in a solid sample. The generation range is at a depth of 100nm-1um, and the energy is relatively high, which is less than or equal to ...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/22
Inventor 周俊武王竹萌徐宁赵建军贾木欣李鹏程应平
Owner BEIJING GENERAL RES INST OF MINING & METALLURGY