Test circuit, display device and test method of driving circuit

Abstract

The invention provides a test circuit, a display device and a test method of a driving circuit. The test circuit comprises a first signal input line, a first signal output line and a plurality of first thin film transistors, wherein the first signal input line is connected with grid electrodes of the first thin film transistors, the first signal output line is connected with first electrodes of the first thin film transistors, and second electrodes of the first thin film transistors are connected with the driving circuit. Therefore, under the condition of not increasing production technology processes, the working performance of the driving circuit can be evaluated in the production process, an abnormal position can be accurately determined, and performance and the yield of products are improved.

Description

technical field

[0001] The invention relates to the field of display technology, in particular to a test circuit, a display device and a test method for a drive circuit. Background technique

[0002] Gate Driver on Array (GOA) technology is a process technology that directly manufactures a driving circuit on an array substrate, thereby replacing a driving chip made of an external silicon chip. The technology can reduce the technological process, reduce the technological cost, and improve the integration degree of the liquid crystal display panel.

[0003] The production process of the driving circuit is complicated, and any abnormality in the process may cause the product to be defective. Therefore, a test circuit that can timely and effectively judge whether the driving circuit is operating effectively is needed.

[0004] figure 1 It is a structural schematic diagram of a test circuit in the prior art. Such as figure 1 As shown, the test circuit tests the drive circuit ...

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