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Lever-type tensile fixture for horizontal type material stretch compression tester for atomic force microscope

An atomic force microscope, stretching and compression technology, applied in the direction of analyzing materials, scanning probe microscopy, measuring devices, etc., can solve the problems that the stretching function of the material cannot be realized, and the fixture cannot be loaded.

Active Publication Date: 2015-01-28
SHANGHAI NAT ENG RES CENT FORNANOTECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Due to the limitation of the structure of the horizontal material tensile and compression testing machine and the sample space of the atomic force microscope, the horizontal material tensile and compression testing machine used with the atomic force microscope cannot be loaded with the existing fixtures during use, so that the tensile function of the material cannot be realized. Therefore, , it is necessary to design a tensile fixture for a horizontal material tensile and compression testing machine for an atomic force microscope

Method used

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  • Lever-type tensile fixture for horizontal type material stretch compression tester for atomic force microscope
  • Lever-type tensile fixture for horizontal type material stretch compression tester for atomic force microscope
  • Lever-type tensile fixture for horizontal type material stretch compression tester for atomic force microscope

Examples

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Embodiment 1

[0038] Example 1: A lever-type tensile fixture for a horizontal material tensile and compression testing machine used in conjunction with an atomic force microscope. The tensile device is composed of a left fixture A and a right fixture (B).

[0039] The left fixture A is composed of a base frame 1, a fixed circle 2, a fixture cover plate 3, a bolt 4, and a pin 9. The base frame 1 of the left fixture is composed of a horizontal material tensile compression testing machine connection mechanism 11, a horizontal material tensile compression testing machine, and a horizontal material tensile compression testing machine. The testing machine fixing mechanism 12, the fixture extension mechanism 13, the atomic force microscope sample space extension mechanism 14, and the fixture base 15 are composed. The extension and compression testing machine fixing mechanism 12 has external threads. The central horizontal plane of the connection mechanism 11 of the horizontal material tensile co...

Embodiment 2

[0046] Example 2: A lever-type tensile fixture for a horizontal material tensile and compression testing machine used in conjunction with an atomic force microscope. The tensile device is composed of a left fixture A and a right fixture (B).

[0047] The left fixture A is composed of a base frame 1, a fixed circle 2, a fixture cover plate 3, a bolt 4, and a pin 9. The base frame 1 of the left fixture is composed of a horizontal material tensile compression testing machine connection mechanism 11, a horizontal material tensile compression testing machine, and a horizontal material tensile compression testing machine. The testing machine fixing mechanism 12, the fixture extension mechanism 13, the atomic force microscope sample space extension mechanism 14, and the fixture base 15 are composed. The extension and compression testing machine fixing mechanism 12 has external threads. The central horizontal plane of the connection mechanism 11 of the horizontal material tensile co...

Embodiment 3

[0055] Example 3: A lever-type tensile fixture for a horizontal material tensile and compression testing machine used in conjunction with an atomic force microscope. The tensile device is composed of a left fixture A and a right fixture (B).

[0056] The left fixture A is composed of a base frame 1, a fixed circle 2, a fixture cover plate 3, a bolt 4, and a pin 9. The base frame 1 of the left fixture is composed of a horizontal material tensile compression testing machine connection mechanism 11, a horizontal material tensile compression testing machine, and a horizontal material tensile compression testing machine. The testing machine fixing mechanism 12, the fixture extension mechanism 13, the atomic force microscope sample space extension mechanism 14, and the fixture base 15 are composed. The extension and compression testing machine fixing mechanism 12 has external threads. The central horizontal plane of the connection mechanism 11 of the horizontal material tensile co...

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Abstract

The invention provides a lever-type tensile fixture for a horizontal type material stretch compression tester for an atomic force microscope. The lever-type tensile fixture comprises a left clamp and a right clamp, wherein each of the left clamp and the right clamp is composed of a bed frame, a fixed ring, a clamp cover board, a bolt and a pin, wherein the bed frame of each clamp is composed of a connecting mechanism of the horizontal type material stretch compression tester, a fixing mechanism of the horizontal type material stretch compression tester, a clamp lengthening mechanism, a sample space lengthening mechanism of the atomic force microscope, and a base of the clamp. A lever bracket connected to the base of the clamp is arranged in the middle of the clamp cover board, and a motor board and a resistance board are arranged on the left side and the right side of the clamp cover board. According to the lever-type tensile fixture provided by the invention, a sample is fixed on the base of the clamp under the lever action of the clamp cover board. The lever-type tensile fixture is made of metal materials or other hard materials, is easy to manufacture, can achieve special requirements for the clamps due to the structure of the horizontal type material stretch compression tester and the space limitation of the sample of the atomic force microscope, and can meet requirement for stretching the material in the horizontal type material stretch compression tester matched with the atomic force microscope.

Description

technical field [0001] The invention relates to testing equipment for mechanical properties of materials, in particular to a lever-type tensile fixture for a horizontal material tensile and compression testing machine used in conjunction with an atomic force microscope. Background technique [0002] In order to organically combine the measurement of the mechanical properties of nanomaterials and products with the detection of microscopic morphology, micro-nano observation instruments such as atomic force microscopes (AFM) should be used in conjunction with some mechanical testing devices, so that the properties of various nanomaterials and products can be deeply explored. Microscopic damage fracture behavior and mechanism, and its correlation with load action, material structure and performance. [0003] In view of this situation, the inventor has developed a horizontal material tension and compression testing machine for atomic force microscope. The transmission mechanism i...

Claims

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Application Information

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IPC IPC(8): G01N3/04G01Q60/24
Inventor 何丹农钟建
Owner SHANGHAI NAT ENG RES CENT FORNANOTECH