9 results about "Microscopic morphology" patented technology

The invention discloses a system and a method for lossless dynamic measurement of microstructure characteristics of a material surface, and relates to the technical field of optical measurement, and the method comprises the following steps: S1, placing an object to be measured on a two-dimensional stepping motor platform, and adjusting the platform to be horizontal; and starting the solid laser. According to the invention, an optical system composed of a solid laser, a beam expander, an aperture diaphragm and a spectroscope generates an accurate detection light beam, a spatial filter designed according to a confocal diffraction limit is matched to effectively suppress defocus stray light interference, and a multi-parameter fusion judgment mechanism is combined to synchronously extract a light intensity peak value and a light spot centroid offset, so that the detection accuracy is improved. The focus is judged only when the light intensity reaches the maximum value and the mass center offset is smaller than the threshold value, the positioning precision is greatly improved, Z-axis coordinate errors are dynamically corrected through real-time vibration compensation and thermal drift compensation, the problems of sample damage and optical method noise interference in traditional contact measurement are solved, and undistorted data support is provided for microstructure three-dimensional reconstruction.

This invention discloses a method for obtaining the brittle-plastic transition depth of a two-phase composite material. The method involves using a metallographic microscope to capture a microscopic image of the scratch surface morphology. The locations of the first small pit and the first large pit in the scratch are determined from this image. Then, the distances from these two locations to the scratch incision point are measured using a measuring scale. The three-dimensional morphology of the scratch groove is obtained by photographing it using a white light interferometer. Based on the distances obtained from the measuring scale, the starting point (first small pit) and the ending point (first large pit) of the brittle-plastic transition zone are determined. The cross-sectional profile curve of the scratch at these locations is then captured, and the groove depth is measured. This invention combines the microscopic morphology captured by a microscope with the three-dimensional morphology obtained by white light interferometry to accurately determine the location and depth of the brittle-plastic transition in the material. This avoids interference from defects in the two-phase composite material itself or surface impurities and dust, effectively improving the accuracy of the test results.

The invention discloses a microchannel plate reaming concentricity testing method and device, and relates to the technical field of microchannel plate detection. According to the main technical scheme, the method comprises the following steps: selecting a first test region in a functional region of an MCP flaring end surface subjected to reaming treatment, and obtaining a microscopic morphology image containing a preselected characteristic channel circumferential contour; turning over the sample, and acquiring a microscopic image of a second test area at a position corresponding to the non-flaring end surface; as the two surfaces are in a positive and negative correspondence relationship, after the second test area image is subjected to mirror image overturning, the second test area image and the first test area image can realize spatial accurate alignment on the same-name micropore channel; and mapping the two images to the same Cartesian coordinate system in a unified manner, comparing the center coordinate offsets of the same characteristic channel in the circumferential contours of the two images, and converting the center coordinate offsets into actual physical sizes in combination with an image scale, thereby quantitatively obtaining the chambering concentricity test result of the MCP sample. According to the method, high-precision and visual representation of the submicron concentricity deviation is realized.

This invention proposes a method and storage medium for evaluating the reliability and lifespan of thermal barrier coatings, comprising: S1, characterizing and analyzing the microstructure of the sample to obtain the microscopic morphology image of the ceramic layer and the property parameters of the sample, and establishing a geometric model; S2, conducting coupled thermal shock and CMAS corrosion experiments on the sample until its failure, recording load parameters and determining the main failure modes and CMAS melt penetration behavior through cross-sectional analysis; S3, forming a set of thermo-coupling failure control equations based on the main failure modes and penetration behavior; inputting the geometric model and the set of thermo-coupling failure control equations into finite element software for solving to obtain simulated crack morphology and stress distribution results; S4, establishing a limit state equation based on the set of thermo-coupling failure control equations with the actual critical energy release rate as the criterion; S5, calculating the failure probability based on the limit state equations; S6, constructing a lifespan prediction model based on the limit state equations to predict the lifespan of the thermal barrier coating under test.

The invention relates to the technical field of optical microscopic imaging and spectrum detection, and discloses a hyperspectral microscope. The microscope comprises a microscope objective, an optical splitter, a tube lens, an image plane and an incident spectrum light source, the microscope objective adopts an apochromatic objective, the optical splitter is of a semi-transparent and semi-reflective structure, the tube lens is of an achromatic type, and the image plane integrates a signal processing circuit and a high-speed data interface. The incident spectrum light source has the capability of outputting monochromatic light beams with high spectral resolution; the equipment is equipped with an automatic control module and a calibration module, and core components are fixed on the same optical platform. The device overcomes the defects of chromatic aberration, light loss, poor stability and the like of existing equipment, realizes high-precision and high-efficiency acquisition of microscopic morphology and hyperspectral data of an observed object, and is suitable for microscopic spectral analysis in the fields of biomedicine, material science and the like.

The present application relates to the technical field of biological fermentation, in particular to an unattended AI intelligent biological fermentation tank and a control method, comprising: a key data acquisition module for acquiring a key metabolite concentration time sequence and a microbial microscopic morphology image sequence in the tank; wherein the microbial microscopic morphology image sequence contains branch degree and vacuolization characteristic data of mycelium / cells; a flow state feature extraction module for constructing a metabolic flow intensity curve based on the key metabolite concentration time sequence.The present application synchronously acquires the key metabolite concentration time sequence and the microbial microscopic morphology image sequence by constructing an in-vitro circulating sampling flow path, and performs time stamp alignment, and this dual perception mechanism can not only capture chemical changes of metabolites, but also can early warn cell stress response through microbial morphology, thereby improving the sensitivity and foresight of state perception, and solving the problems of state monitoring lag and one-sidedness.

This invention relates to a wafer defect detection method and apparatus based on multimodal data and graph neural networks. The method includes: constructing a multimodal heterogeneous dataset for heterogeneous dual wafers; establishing a wafer spatial topology model based on a dual-graph structure; designing a cross-interface bipartite interaction and spatial alignment mechanism; implementing energy projection from the global physics field to local grid points; predicting latent defects based on spatiotemporal evolution memory; and outputting the detection results. This application improves the accuracy of interface void prediction by constructing a dual-graph interactive neural network to model the microscopic morphological mismatch between heterogeneous wafers and introduces a physics field projection mechanism to correlate macroscopic processes with microscopic defects. Combined with spatiotemporal evolution memory for long-range attribution of latent defects, it enhances the accuracy of interface void prediction and provides a decision-making basis for process optimization in advanced manufacturing processes.

The screening method comprises the following steps: S1, sample treatment: taking a high-temperature yeast sample, adding sterile water, oscillating and uniformly mixing, and then carrying out gradient dilution; s2, primary screening: coating a PDA culture medium with the diluent, and separating and purifying yeast strains through colonial morphology observation and microscopic morphology observation after constant-temperature culture; s3, secondary screening: inoculating the purified yeast strain to a tributyrin solid culture medium, performing constant-temperature culture, and screening out a strain with relatively high ester production capacity according to the size of a transparent circle around a bacterial colony; s4, molecular biological identification: constructing a clear strain taxonomic status through sequence alignment and phylogenetic tree construction; and S5, fermentation condition optimization: determining key influence factors through a single factor test, and optimizing fermentation conditions by adopting a response surface test to obtain optimal ester production fermentation parameters. According to the method, high-efficiency screening and fermentation condition optimization of the high-yield ester yeast in the high-temperature yeast for making hard liquor are realized through targeted screening and accurate identification.

This invention provides a micro-Raman detection system for in-situ monitoring of nucleation changes in a nucleation reactor, comprising: a nucleation reactor, a microfluidic channel, a vacuum sampler, a micro-Raman detection unit, and a signal control and acquisition device. By coupling and integrating laser technology with an optical microscope, the system achieves precise and rapid focusing of incident light using a microscope objective, simultaneously acquiring the microscopic morphology of the sample surface. Combined with three-dimensional displacement adjustment of the microscope stage, it allows for targeted detection and analysis of specific micro-regions of the sample, with the system's smallest spot size reaching the micrometer level. Simultaneously, using the microscope objective as a Raman detection module, a 180°... o The backscattering excitation-collection mode concentrates the average laser intensity at the focal point, effectively enhancing the Raman scattering signal at the target site and ensuring efficient acquisition and transmission of the Raman signal, thus forming a microscopic Raman detection unit. This invention enables in-situ monitoring of structural changes in nanoparticles during nucleation, such as changes in the metal-oxygen bond in the nucleus and interlayer anions.