A method for measuring grating parameters of light pillar laser paper by utilizing a spectrophotometer

Abstract

The invention relates to a method for measuring grating parameters of light pillar laser paper by utilizing a spectrophotometer. The method comprises the following steps: according to a grating equation, drawing a distribution relation graph of grating constants and wave lengths under different diffraction angles and diffraction order numbers; utilizing the multi-angle spectrophotometer to collect spectroscopic data of the light pillar laser paper at different measurement areas along the light pillar direction and vertical to the light pillar direction, and drawing a spectral energy curve distribution diagram under different probing angels; with the distribution relation of grating constants and the wave lengths under different diffraction angles and diffraction order numbers, analyzing change rules of the obtained spectroscopic data and calculating grating constants of rating strips; and fixing the relative position of an unthreaded hole of the multi-angle spectrophotometer and the laser paper, rotating plane of the light pillar laser paper for 90 DEG, measuring spectral information of the same place, and deducing ruling direction of the rating strips of the light pillar laser paper. The method solves the problem, that the laser paper is difficult to measure accurately, puzzled in scientific community and industrial community to some degree; and the method has the advantages of being convenient to operate and simple and fast.

Description

technical field [0001] The invention relates to a method for measuring the grating parameters of light column laser paper with a spectrophotometer. The spectral information of different positions on the light column laser paper is measured by using an X-Rite MA68Ⅱ multi-angle spectrophotometer, and the grating stripes corresponding to different grating constants are different. The relationship between the diffraction main wavelength and the diffraction angle of the diffraction order is proposed, and a method can be used to measure the parameters of the beam laser paper grating with the X-Rite MA68Ⅱ multi-angle spectrophotometer. Background technique [0002] Laser film and laser transfer paper have a special bright rainbow effect, and at the same time have certain anti-counterfeiting properties, which are deeply loved by packaging and printing companies. However, packaging and printing companies generally do not understand the processing technology of laser film and laser tr...

AI Technical Summary

Problems solved by technology

It solves the problem that high-magnification magnifying glass is needed for the measurement of the microstructure of optical column-based laser paper. The measurement of the microscopic parameters of the grating can be completed directly with a spectrophotometer. This method is suitable for the measurement of microscopic parameters and color quality evaluation of all optical column laser paper.

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