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Multichannel SRAM single-event test method and device

A test device and single particle technology, applied in static memory, instruments, etc., can solve problems such as low efficiency and inability to monitor chip latch-up effect at the same time, and achieve the effect of improving accuracy and preventing latch-up effect

Active Publication Date: 2015-04-08
INST OF MICROELECTRONICS CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The existing single event test system does not specifically test for SRAM devices. When testing the single event effect of SRAM devices, it cannot monitor the latch-up effect of the chip at the same time, and the efficiency is not high.

Method used

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  • Multichannel SRAM single-event test method and device

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Embodiment Construction

[0028] Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary only for explaining the present invention and should not be construed as limiting the present invention.

[0029] The invention provides a multi-channel SRAM single particle testing device, which comprises: a test board and a main control board; wherein,

[0030] The test board is used to fix and connect the chip to be tested; the main control board is used to control the radiation test system, and read and record the data in the chip to be tested.

[0031] Wherein, the main control board includes:

[0032] The power supply module is used to convert the input power into different voltages required by each module; the communication module is ...

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Abstract

The invention provides a multichannel SRAM single-event test device which comprises a test board and a main control board, wherein the test board is used for fixing and connecting a to-be-tested chip, and the main control board is used for controlling an irradiation testing system and reading and recording data in the to-be-tested chip. The device can test single event effects of multiple SRAM devices at the same time, obtains characteristic parameters of the single event effects, improves the accuracy of estimating the single event effect resistance of a to-be-tested device, and further can detect the working current of the to-be-tested device in real time, so as to avoid the generation of latch-up.

Description

technical field [0001] The invention relates to the field of device reliability, in particular, to a single particle testing method and device. Background technique [0002] Because SRAM memory has the advantages of fast access speed, etc., SRAM is widely used in the development of spacecraft to store configuration information, test data, etc. While the spacecraft is flying in space, it has been in the radiation environment composed of charged particles. The high-energy protons and heavy ions in the space radiation environment, and the neutrons in the atmospheric environment can all cause single event effects to occur in the SRAM devices in the spacecraft, making The data stored in the SRAM changes randomly, which affects the reliability of the device, so the ability of the SRAM device in the spacecraft to resist the single event effect is directly related to the stability of the spacecraft. [0003] The existing single event test system does not have a special test for SRA...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/56
Inventor 刘倩茹赵发展刘刚罗家俊韩郑生
Owner INST OF MICROELECTRONICS CHINESE ACAD OF SCI
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