Chip measuring sorting system and method
A sorting system and chip technology, which is applied in semiconductor/solid-state device testing/measurement, electrical components, semiconductor/solid-state device manufacturing, etc., can solve the problems of high production cost and low production efficiency, so as to improve work efficiency and reduce hardware Cost and labor cost, effect of reducing process steps
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[0028] In order to make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be described clearly and completely in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of the embodiments of the present invention, not all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of the present invention.
[0029] In the following specific embodiments of the present invention, the specific structure of the measurement and sorting system of the chip proposed by the present invention and the connection relationship and working mode of the various devices of the system in the working state are explained through a more detailed implementation...
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