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Three-dimensional stacked semiconductor structure and manufacturing method thereof

A semiconductor and stacking technology, applied in the direction of semiconductor devices, electrical solid devices, electrical components, etc., can solve difficulties, increase source contacts and align upper conductive plugs, etc.

Inactive Publication Date: 2018-04-13
MACRONIX INT CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Furthermore, the source contact and the bit line of the traditional stacked structure are built on the same level, which will increase the difficulty of alignment between the source contact and the upper conductive plug when receiving the source contact process.

Method used

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  • Three-dimensional stacked semiconductor structure and manufacturing method thereof
  • Three-dimensional stacked semiconductor structure and manufacturing method thereof
  • Three-dimensional stacked semiconductor structure and manufacturing method thereof

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Embodiment Construction

[0040] In an embodiment of the present disclosure, a three-dimensional stacked semiconductor structure and related manufacturing methods are presented. The three-dimensional stacked semiconductor structure proposed in the embodiment has a lower source contact (source contacts) resistance, a stable structure that can reduce the impact of the word line process (WL loading effect), and good reliability (reliability) electronic characteristics . Moreover, the three-dimensional stacked semiconductor structure of the embodiment has simple steps in fabrication, and can be completed without using time-consuming and expensive processes.

[0041] Embodiments of the present invention have a wide variety of applications. For example, it can be applied to a three-dimensional flash memory, such as a fan-out area of ​​a three-dimensional NAND flash memory, but the present invention is not limited to this application. The following are related embodiments, together with figures, to illustra...

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Abstract

The invention discloses a three-dimensional stacked semiconductor structure and a manufacturing method thereof. The three-dimensional stacked semiconductor structure includes: a plurality of stacked layers formed on a substrate, at least one contact hole vertically formed in one of the stacked layers, a Conductors are formed in the contact holes, and a charge trapping layer is formed at least at sidewalls of these stacked layers. One of the laminations includes a multi-layer pillar body, which is formed by alternately stacking multiple insulating layers and multiple conductive layers, and a dielectric layer is formed on the multi-layer pillar body. Contact holes pass through the corresponding stacked dielectric layers, the insulating layers and the conductive layers. Conductors in the contact holes connect the conductive layers of the corresponding stack. Wherein, the upper surface of the conductor is higher than the upper surface of the corresponding stacked multi-layer pillars.

Description

technical field [0001] The present invention relates to a three-dimensional stacked semiconductor structure and its manufacturing method, and more particularly to a three-dimensional stacked semiconductor structure with a conductive strip connecting source contacts and its manufacturing method. Background technique [0002] A great feature of non-volatile memory element design is the ability to preserve the integrity of the data state when the memory element loses or removes power. Currently, many different types of non-volatile memory devices have been proposed in the industry. However, related companies are still developing new designs or combining existing technologies to stack memory cell planes to achieve a memory structure with higher storage capacity. For example, some three-dimensional stacked NAND gate (NAND) flash memory structures have been proposed. However, there are still some problems to be solved in the conventional 3D stacked memory structure. [0003] f...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L27/115H01L27/11578H10B69/00H10B43/20
Inventor 赖二琨
Owner MACRONIX INT CO LTD