Early fault diagnosis method for complex equipment
A technology for early failure and diagnosis methods, applied in the testing of measuring devices, instruments, machines/structural components, etc., can solve problems such as difficult fault diagnosis, multiple monitoring signals, and difficulty in establishing envelope models, and achieves less circuit sample data. Fast convergence and high accuracy
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[0029] The technical solution of this patent will be further described in detail below in conjunction with specific embodiments.
[0030] see image 3 , an early fault diagnosis method for complex equipment, the specific steps are as follows:
[0031] (1) extracting and collecting signals through sensors;
[0032] (2) Carry out wavelet transform denoising to the signal of extraction collection;
[0033] (3) Establish a fault diagnosis model based on BP neural network and a fault diagnosis model based on SVM for mechanical characteristics and circuit characteristics, and carry out fault diagnosis.
[0034] see Figure 4 , the method for fault diagnosis based on the fault diagnosis model of BP neural network, the specific steps are as follows:
[0035] (1) The sensor is connected to the mechanical equipment to extract the acquisition signal;
[0036] (2) Perform wavelet transform denoising processing on the extracted and collected signals, and then perform original data dia...
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