An Unreliable Test Optimization Method Based on Block Coding Genetic Algorithm
A genetic algorithm and group coding technology, applied in the field of board-level circuit fault diagnosis, can solve problems such as many constraints and large amount of calculation
Inactive Publication Date: 2017-10-31
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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However, in the case of sub-process testing, due to the large number of constraints, the amount of calculation required for testing and optimization using this method is very large
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[0043] figure 2 It is a specific implementation flow chart of the unreliable test optimization method based on block coding genetic algorithm of the present invention. Such as figure 2 Shown, the present invention is based on the unreliable test optimal method of group coding genetic algorithm and comprises the following steps:
[0044] S201: Set the serial number k of the testing process=1.
[0045] S202: Generate an initial population:
[0046] All tests under the kth test process are regarded as a group, and the coding of each individual chromosome in the population is the Boolean vector corresponding to the different test sets of all tests in the group, and X individuals are randomly generated according to the preset population size X.
[0047] In the process of testing a board-level circuit system, a total of |T| tests are used, and the entire test process is divided into K test procedures, which use |T 1 |a test, used in process 2 |T 2 |a test, and so on, the |T is ...
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The invention discloses an unreliable test optimization method based on grouping coding genetic algorithm. All tests under each test procedure are regarded as a group, and genetic algorithm is used for each group to obtain the optimal test set under the test procedure. The setting rule of the individual fitness function in the genetic algorithm is: when the detection rate of the test set corresponding to the individual chromosome code does not reach the target detection rate index of the preset testing process, the fitness value is 0. When the target detection rate index of the process is used, the lower the sum of the test costs of the selected tests in the test set corresponding to the individual chromosome codes, the greater the value of the fitness function; the optimal test sets obtained under each test process are combined to obtain the total test set, If the detection rate of the total test set does not reach the total target detection rate, add unselected tests one by one until the total target detection rate is met. The present invention improves the optimization efficiency under the condition of maintaining the precision.
Description
technical field [0001] The invention belongs to the technical field of fault diagnosis of board-level circuits, and more specifically relates to an unreliable test optimization method based on group coding genetic algorithm. Background technique [0002] In the fault diagnosis process of the board-level circuit system, due to the influence of various factors such as electromagnetic interference and environmental changes, the test results are not necessarily completely accurate. If these uncertain factors are ignored in the actual testing process, it is likely to lead to wrong test results. Misdiagnosis will generate additional testing costs. As the complexity of the system increases, the additional testing costs are likely to exceed the cost of the test itself. It is particularly important to consider the unreliability of the test itself. During board-level circuit testing, the entire testing process often requires multiple testing procedures to complete, and each testing ...
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IPC IPC(8): G01R31/28G06N3/12
Inventor 杨成林焦志敏刘震
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA