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Method and system for characterizing cells using input waveforms generated considering different circuit topologies

A circuit topology, input waveform technology, applied in CAD circuit design, electrical digital data processing, design optimization/simulation, etc., can solve the problems of delay calculation accuracy, distortion, etc.

Active Publication Date: 2018-04-17
TAIWAN SEMICON MFG CO LTD
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  • Summary
  • Abstract
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Problems solved by technology

However, as technology advances, such as increasing lengths of interconnects used for circuit connections and the effect of increasing Miller capacitance in miniaturized transistors and non-planar transistors, leads to distortion of the propagated input waveform relative to the intended input waveform
The accuracy of the delay calculation suffers when the distortion of the propagated input waveform is ignored

Method used

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  • Method and system for characterizing cells using input waveforms generated considering different circuit topologies
  • Method and system for characterizing cells using input waveforms generated considering different circuit topologies
  • Method and system for characterizing cells using input waveforms generated considering different circuit topologies

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Embodiment Construction

[0056] Embodiments or examples of the invention illustrated in the drawings will now be described using specific language. It should be understood, however, that no limitation of the scope of the invention is intended. It is contemplated that any alterations and modifications in the described embodiments, and any further application of the principles described in this document would normally occur to one of ordinary skill in the art. Reference numerals may be repeated in all embodiments, but even if they share the same reference numeral, it is not necessarily required that features of one embodiment apply to another embodiment.

[0057] Some embodiments have one or a combination of the following features and / or advantages. In some embodiments, the cell is characterized according to the input transfer characteristic taking into account different circuit topologies of the pre-drivers of the driving cell to obtain the same input transfer characteristic. In some embodiments, the...

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Abstract

The present invention provides a characterization unit using input waveforms generated taking into account different circuit topologies. In some embodiments, in a method executed by at least one processor, different circuit topologies of pre-drivers of the driving unit are considered to obtain the same input conversion characteristics, and the unit is characterized by at least one processor with respect to the input conversion characteristics. .

Description

technical field [0001] The present invention generally relates to the field of semiconductor technology, and more particularly, relates to a design method and system for an integrated circuit. Background technique [0002] In the design flow for integrated circuit (IC) chips, static timing analysis for estimating delays of electronic circuits is used at various stages, for example, to verify correct operation and optimize the performance of IC chip designs. One factor that affects the accuracy of delay calculations for static timing analysis is the similarity of the predetermined input waveforms used to characterize the cells to calculate delays to the input waveforms propagated to the cells in the circuit performing the static timing analysis. However, as technology advances, such as increasing lengths of interconnects used for circuit connections and the effect of increasing Miller capacitance in miniaturized transistors and non-planar transistors, leads to distortion of t...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F17/50
CPCG06F30/3312G06F30/398G06F30/392G06F30/39G06F2119/12G06F30/13G06F30/00G06F30/20G06F2119/18G06F30/3315
Inventor 谭竞豪陈彦宾陈文豪王中兴
Owner TAIWAN SEMICON MFG CO LTD
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