Biaxial stress high temperature creep deformation test apparatus
Patent Information
- Authority / Receiving Office
- CN ยท China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- ELECTRIC POWER RES INST OF GUANGDONG POWER GRID
- Publication Date
- 2015-07-15
- Estimated Expiration
- Not applicable ยท inactive patent
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Abstract
Description
technical field
[0001] The invention relates to a high-temperature creep test device, in particular to a bidirectional stress high-temperature creep test device. Background technique
[0002] High-temperature creep refers to the slow plastic deformation of the sample under continuous stress in a high-temperature environment, and the stress is much smaller than the yield strength of the material, which can be either tensile or compressive. High temperature creep can effectively predict the strain trend and fracture life of materials after long-term service under high temperature and stress, which is an important mechanical performance parameter. Existing high-temperature creep samples are usually subjected to continuous action under uniaxial tensile load at high temperature, and an auxiliary measurement and recording system is added, and the test is carried out in accordance with "GB / T 2039-2012 Metal Materials Uniaxial Tensile Creep Test Method".
[0003] In the prior art, ...