Waveguide structure, waveguide coupling structure, and preparation method

A technology of waveguide structure and silicon waveguide, which is applied in the direction of light guide, optics, instrument, etc., can solve the problems of large refractive index difference of silicon waveguide, high temperature sensitivity of silicon-based arrayed waveguide grating, no athermal solution, etc.

Active Publication Date: 2018-06-26
HUAWEI TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Second, the temperature sensitivity of silicon-based arrayed waveguide gratings is high, and there is no mature athermal solution, so a semiconductor refrigerator (TEC for short) is required for temperature control, which also increases power consumption
Third, due to the large difference in the refractive index of the silicon waveguide, the polarization dependence is very large
However, the crosstalk value of this scheme cannot meet the design requirements of optical splitters

Method used

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  • Waveguide structure, waveguide coupling structure, and preparation method
  • Waveguide structure, waveguide coupling structure, and preparation method
  • Waveguide structure, waveguide coupling structure, and preparation method

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Embodiment 1

[0080] see image 3 , is a schematic diagram of the waveguide structure 100 provided by the present invention, the waveguide structure is protruding, the waveguide structure is applied to the straight waveguide part of the arrayed waveguide AW in the SOI-based arrayed waveguide grating, and the waveguide structure 100 adopts SOI crystal The silica in the circle serves as the lower cladding.

[0081]The waveguide structure 100 includes two first end portions 100a arranged axially symmetrically. The first end portion 100a is sequentially divided into a first area A, a second area B and a third area C along a direction close to the axis of symmetry. The waveguide structure 100 includes a first silicon substrate layer 10 , a second silicon substrate layer 20 , a first silicon dioxide layer 30 , a second silicon dioxide layer 40 and a first silicon waveguide layer 50 .

[0082] Comprehensive reference image 3 and Figure 4 , in the first region A, the first silicon substrate l...

Embodiment 2

[0097] see Figure 8 , is a structural schematic diagram of the waveguide structure 200 provided by the present invention, the waveguide structure 200 is buried, and the waveguide structure 200 is applied to the straight waveguide part of the arrayed waveguide AW in the SOI-based arrayed waveguide grating. The waveguide structure 200 adopts a structure in which a low refractive index waveguide layer is added on the surface of silicon photonics.

[0098] The waveguide structure 200 includes two first end portions 200a arranged axially symmetrically. The first end portion 200a is divided into a first region D, a second region E and a third region F along a direction close to the axis of symmetry. The waveguide structure 200 includes a third silicon substrate layer 110 , a third silicon dioxide layer 120 , a second silicon waveguide layer 130 , a first waveguide layer 140 and a second waveguide layer 150 stacked in sequence. The coverage area of ​​the second silicon waveguide l...

Embodiment 3

[0113] see Figure 13 , the present invention also discloses the application of the waveguide coupling structure 300 provided in Embodiment 1, and the waveguide coupling structure is used in a mode-spot converter for coupling a silicon waveguide and a laser source. The structure of the waveguide coupling structure 300 in this embodiment is roughly the same as that of the waveguide structure 100 in Embodiment 1, the difference is that the waveguide coupling structure 300 is only half of the structure of the waveguide structure 100 . And, it is coupled with the laser source in the third region I.

[0114] The waveguide coupling structure 300 is divided into a first region G, a second region H and a third region I along a direction close to the laser source. The waveguide coupling structure 300 includes a fourth silicon substrate layer 310 , a fifth silicon substrate layer 320 , a fourth silicon dioxide layer 330 , a fifth silicon dioxide layer 340 and a third silicon waveguide...

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Abstract

The present invention provides three waveguide structures, including a protruding-type waveguide structure, a buried-type waveguide structure, and a redeposited-type waveguide structure. The three types of waveguide structures are all applied to a straight waveguide part of an arrayed waveguide in an SOI-based arrayed waveguide grating; the protruding-type waveguide structure includes two axisymmetrically disposed first ends, and the first end is sequentially divided into a first region, a second region, and a third region in a direction toward an axis of symmetry; and the waveguide structure includes a first silicon substrate layer, a second silicon substrate layer, a first silicon dioxide layer, a second silicon dioxide layer, and a first silicon waveguide layer. A corresponding method for producing a waveguide structure, and a waveguide coupling structure are further provided. The waveguide structure and the waveguide coupling structure that are provided in the present invention have advantages of a small size, low polarization dependence, and low temperature sensitivity, and a crosstalk value is greater than 25 dB, which meets a requirement of a passive optical network system, and provides feasibility for commercialization of the arrayed waveguide grating.

Description

technical field [0001] The invention relates to the field of optical communication devices, in particular to a waveguide structure, a waveguide coupling structure, and a preparation method. Background technique [0002] With the upgrading of network products, the size and power consumption of modules used in the network are constantly decreasing to meet the needs of continuous cost reduction and performance improvement. Due to its ultra-small size and low cost, silicon-based photonic devices have attracted extensive attention from the industry in recent years, and have become one of the key considerations in the upgrading of network products. [0003] In the prior art, the process error of the silicon waveguide has a great influence on the refractive index of the waveguide. This effect leads to random changes in the refractive index at different positions of the silicon waveguide, resulting in large random changes in the operating wavelength of silicon-based photonic device...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G02B6/124
CPCG02B6/124G02B6/12011G02B6/12023G02B6/12026G02B6/1228G02B2006/12038G02B2006/12061
Inventor 胡菁周小平
Owner HUAWEI TECH CO LTD
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