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Superhigh-spectral resolution X ray grazing incidence microimaging system

A microscopic imaging and grazing incidence technology, which is applied in the fields of X-ray optics and ion plasma diagnosis, can solve the problems of poor energy resolution of multilayer films, etc., and achieve the effects of small solid angle of receiving light, enhanced practicability, and reduced aberrations

Active Publication Date: 2015-08-05
LASER FUSION RES CENT CHINA ACAD OF ENG PHYSICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, at present, the energy resolution of multilayer films is poor, and generally only reaches tens of eV, which is difficult to meet the experimental requirements.

Method used

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  • Superhigh-spectral resolution X ray grazing incidence microimaging system
  • Superhigh-spectral resolution X ray grazing incidence microimaging system
  • Superhigh-spectral resolution X ray grazing incidence microimaging system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0030] figure 1 , figure 2 It is a schematic diagram of the optical path of Embodiment 1 of the present invention. The first optical device 1 adopts a multilayer film reflector, and the second optical device 2 adopts a curved crystal. The optical axes of the multilayer film reflector and the curved crystal are perpendicular to each other. The X-ray passes through the multi-layer film mirror and is focused in the meridional direction to form a quasi-monochromatic one-dimensional image, and then through the curved crystal to achieve focus in the sagittal direction, and through the curved crystal to split light to form a highly monochromatic two-dimensional image , and finally imaged onto the recording medium. The main parameters of the system are selected according to the requirements of conventional ICF diagnosis. The specific parameters are as follows: working energy point 2.5keV, object distance 142.5mm, distance between mirror and curved crystal 20mm, image distance 2850mm...

Embodiment 2

[0033] Figure 14 , Figure 15 It is a schematic diagram of the optical path of Embodiment 2 of the present invention. Both the first optical device 1 and the second optical device 2 of this embodiment use spherical curved crystals, and the Si (111) crystal plane is selected as the curved crystal reflection surface. According to the Bragg principle, the crystal The surface is 14.308° at 8keV grazing incidence angle (ie Bragg angle). See Table 1 and Table 2 for detailed parameters and optical component parameters.

[0034] Table 1

[0035] object distance

spacing

image distance

energy point

gain

Collecting solid angle

200mm

20mm

4000mm

8keV

20

1×10 -6 sr

[0036] Table 2

[0037]

[0038] Figure 14 , Figure 15 As shown in , 3 is the incident light, 4 is the outgoing light and 5 is the Bragg angle.

[0039] The scheme proposed in Example 2 is simulated by using the X-ray simulation software SHADOW. Ligh...

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Abstract

The invention provides a superhigh-spectral resolution X ray grazing incidence microimaging system. The system comprises two grazing incidence curve X ray optical devices respectively named as a first optical device and a second optical device. Optical axes of the first optical device and the second optical device are orthogonal. X ray emitted by an object point is reflected by the first optical device and then is focused in a meridian direction so that a quasi-monochromatic one-dimensional image is formed, beam splitting and focusing are realized by the second optical device in a sagittal direction so that a high-monochromatic two-dimensional image is formed, and an imaging process is realized on a recording medium. The superhigh-spectral resolution X ray grazing incidence microimaging system has the characteristics of high spatial resolution, good energy resolution and small aberration and well solves the problems of the traditional X ray microscope.

Description

technical field [0001] The invention relates to the fields of plasma diagnosis, X-ray optics and the like, in particular to an ultra-high spectral resolution X-ray grazing incidence microscopic imaging system. Background technique [0002] In the field of X-ray diagnosis, two-dimensional image diagnosis with spectral resolution is an important field. At present, the commonly used plasma two-dimensional distribution diagnosis is mainly divided into three methods: pinhole camera imaging, curved crystal imaging and KB imaging. [0003] Pinhole imaging is the most commonly used imaging method, but due to the limitation of numerical aperture, the spatial resolution and light collection efficiency are low. At the same time, the energy spectrum resolution is realized by adding filters of different materials in the optical path. Due to the energy spectrum selection of the filter itself The bandwidth is very wide, making the energy resolution of the pinhole imaging method poor. [...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/00
Inventor 丁永坤曹柱荣邓博陈韬安宁王秋平江少恩
Owner LASER FUSION RES CENT CHINA ACAD OF ENG PHYSICS
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