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Node connection chip applied to assess human body injury condition and node network thereof

A node connection and chip technology, applied in the field of electronic information, can solve problems such as limitation, failure to provide loop circuits, damage, etc.

Inactive Publication Date: 2015-08-26
ANYCHECK INFORMATION TECH +3
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] The usual practice of existing damage detection systems for assessing human injuries is to place the loop circuit in the area to be tested. When a link of the loop circuit is destroyed, the damage detection system can obtain the damaged information, but Loop circuits do not provide detailed information about broken links
With the development of technology, in order to distinguish the damaged part of the area to be tested, a separate circuit is designed for each part, but it still has the disadvantage that it is difficult to overcome-only a part of it is damaged, and it can be applied to textile clothing Very limited in monitoring textile damage as the technique does not allow the high density of loops created
Therefore, there are subnetworks that include many detection loops connected to the local microcontroller and send local status information to the main processor through the local microcontroller, but a large number of subnetworks means that the data transmission bus requirements are too wide, and the data processing speed slow

Method used

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  • Node connection chip applied to assess human body injury condition and node network thereof
  • Node connection chip applied to assess human body injury condition and node network thereof
  • Node connection chip applied to assess human body injury condition and node network thereof

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Embodiment Construction

[0019] It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0020] The main purpose of the present invention is to provide a node connection chip, which constitutes a damage detection network through the node connection chips, and quickly provides detailed damage information for the damage detection system.

[0021] To achieve the above object, the present invention provides a node connection chip.

[0022] refer to figure 1 , figure 1 Shown is a schematic diagram of the circuit structure of the first preferred embodiment of the node connection chip applied to the evaluation of human injury in the present invention. In one embodiment, the node connection chip includes a microprocessor 1 and a data port 2 signal-connected to the microprocessor 1, the data port 2 includes a switching unit 21, a receiving unit 22 and a sending unit 23, the The data port 2 is connected to the m...

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PUM

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Abstract

The invention discloses a node connection chip comprising a microprocessor and a data port connected with the microprocessor in a signaling way. The data port comprises a switching unit, a receiving unit and a transmitting unit. The node connection chip is connected with other nodes in the signaling way via the data port so that a node network is formed. The microprocessor controls the switching unit so that the receiving unit and the transmitting unit are enabled to communicate with other nodes through data. The node network is formed by the node connection chip through expansion, and detailed node information is transmitted via the node network.

Description

technical field [0001] The invention relates to the field of electronic information technology, in particular to a node connection chip and a node network used in assessing human injuries. Background technique [0002] The usual practice of the existing damage detection system for assessing human injury is to place the loop circuit in the area to be tested. When a link of the loop circuit is destroyed, the damage detection system can obtain the damaged information, but Loop circuits cannot provide detailed information about broken links. With the development of technology, in order to distinguish the damaged part of the area to be tested, a separate circuit is designed for each part, but it still has the disadvantage that it is difficult to overcome-only a part of it is damaged, and it can be applied to textile clothing Monitoring textile damage is very limited because the technique does not allow the creation of high-density loops. Therefore, there are subnetworks that in...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G05B19/418
CPCG05B19/418Y02P90/02G05B19/4188
Inventor 张贯京陈兴明葛新科克里斯基捏·普拉纽克艾琳娜·古列莎王海荣张少鹏方静芳高伟明程金兢梁艳妮周荣李慧玲邢立立波达别特·伊万徐之艳周亮梁昊原肖应芬郑慧华唐小浪李潇云
Owner ANYCHECK INFORMATION TECH
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