The invention discloses a method for rapidly measuring INL and DNL parameters of an ADC product applied to ATE, and relates to the field of parameter measurement, ADC
product data and environmental parameters are obtained and preprocessed, a three-layer neural
network model is configured based on data obtained in S100, error prediction is performed based on an operation result of the three-layer neural
network model in S200, and the three-layer neural
network model is optimized. S300, complementing ADC
product data and adjustment based on the error prediction value obtained in the S300, obtaining complemented data parameters based on the complemented ADC
product data, and performing feedback
processing based on the complemented data parameters obtained in the S500, performing error prediction and
complementation through a neural network model by using a small amount of collected data, significantly reducing the
test data collection amount, greatly reducing the test time and cost, and improving the
test efficiency. Meanwhile, by complementing and correcting the data of the uncollected part, the precision of the test result is ensured, the method is suitable for ADC products with high integration level and
high frequency, and the consistency of the
test efficiency and the product performance is effectively improved.