Feature point identification method aiming at pose measuring of cooperation marker

A recognition method and pose measurement technology, which are applied in instruments, image data processing, computing and other directions to achieve the effect of improving accuracy and reliability

Active Publication Date: 2015-08-26
INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
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This method establishes the recognition frame according to the proportional relationship between the size of the feature point and the size of the target, which suppresses the interference of the complex background outside the image recognition frame on the recognition; divides into 4 quadrants, counts the total number of recognized targets in the 4 quad

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  • Feature point identification method aiming at pose measuring of cooperation marker
  • Feature point identification method aiming at pose measuring of cooperation marker
  • Feature point identification method aiming at pose measuring of cooperation marker

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[0035] The method of the present invention will be further described below in conjunction with the drawings and specific embodiments.

[0036] The specific process is as figure 1 Shown. A feature point recognition method for co-marker pose measurement includes the following steps:

[0037] (1) Set the cooperation marker to be composed of five highly reflective circular feature points, 4 of which are set to form a square, the fifth feature point is set at the center of the square, and the ratio of the side length of the square to the diameter of the feature point is set to R= 8. Get the cooperation marker image, such as figure 2 As shown, the image resolution is 1024×1024.

[0038] (2) Perform threshold segmentation and connected region interpretation of the image obtained in step (1) to obtain a total of 8 connected regions Q in the image i (i=1…8), such as image 3 Shown

[0039] (3) Calculate each Q i Circumference C i And area S i , And calculate Q i The shape factor F i ,

[00...

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Abstract

The invention discloses a feature point identification method aiming at pose measuring of a cooperation marker. The method comprises the steps of: (1) threshold value division and judgment of connected regions; (2) calculating shape factors of the connected regions and solving a round connected region; (3) solving a square identification box according to the diameter of the round connected region, dividing four quadrants in the identification box, and calculating quantity of the connected regions, the shape factors, diameters and distance to the center of the identification box in each quadrant. The cooperation marker and respective feature points in an image are identified. The method solves the problem of identification and positioning of image feature points under the condition that the feature points are partially shielded and interfered in the visual pose measuring process of rendezvous and docking of a spacecraft, and an identification result is accurate and reliable.

Description

technical field [0001] The invention relates to a feature point recognition method, in particular to a feature point recognition method for pose measurement of cooperative markers. Background technique [0002] Vision-based target pose (position, attitude) measurement is the frontier direction of key research in the field of photoelectric precision measurement technology, and plays a pivotal role in space detection, industrial manufacturing, robotics and other fields. Especially in the field of space, accurate measurement of the pose of space objects is an important prerequisite for the success of space tasks (rendezvous and docking, target capture, on-orbit assembly and maintenance, etc.). [0003] Vision-based pose measurement is divided into cooperative target measurement and non-cooperative target measurement. Compared with non-cooperative target measurement, cooperative target measurement has the advantages of high measurement accuracy, strong reliability, strong anti-i...

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Application Information

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IPC IPC(8): G06T7/00
CPCG06T7/73G06T2207/10052
Inventor 赵汝进王进赵人杰王明富洪裕珍颜坤游迪
Owner INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
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