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Measurement method of order production cycle and output

A technology of production cycle and measurement method, applied in forecasting, data processing applications, resources, etc., can solve problems such as poor production planning, failure to consider order placement, product interspersed production process, high prices, etc., and achieve the effect of avoiding output loss

Active Publication Date: 2018-01-26
SEMICON MFG INT (SHANGHAI) CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The method using the VUT equation cannot take into account the interspersed production process of order placement and products, so when applied to the formulation of short-term (such as a few weeks) production planning, poor production planning will be obtained
[0005] If a foreign commercial system is used to formulate a production plan, it will cost a high price

Method used

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  • Measurement method of order production cycle and output
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Embodiment Construction

[0035] In order to make the purpose, technical solution and advantages of the present invention more clear, the present invention will be further described in detail below with reference to the accompanying drawings and examples.

[0036] Such as figure 1 Shown, the measurement method embodiment of order production cycle and output of the present invention, comprises:

[0037] Provide the production process of semiconductor products;

[0038] According to the production process, determine the production machine used to produce the semiconductor product;

[0039] Provide the machine production cycle and the maximum production capacity of each set of production machines used in the production of the semiconductor products;

[0040] Provide the lot (batch) number of the semiconductor product in question;

[0041] Provide order release plan;

[0042] Provide information on the production status of WIP that already exists in the production process;

[0043] Set the unit produc...

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Abstract

The invention discloses a method for measuring the production cycle and output of an order. Through the production process of semiconductor products and the production machines used, as well as the production cycle of the production machines and the maximum production capacity of the machines, each unit production period In , the production process of the order release plan is simulated to obtain short-term or long-term results for the order release plan. In actual use, the method for measuring the order production cycle and output of the present invention is used to simulate the production process, and the production cycle and output information of short-term / long-term production can be obtained based on different order placement plans and production processes, and then for the order The modification of the release plan provides an important basis, and at the same time, it can point out the production bottleneck in the production process in time so as to know in advance and avoid the possible output loss in actual production.

Description

technical field [0001] The invention relates to the field of semiconductor manufacturing, in particular to a method for measuring the production cycle and output of orders for semiconductor products obtained by a wafer production plant. Background technique [0002] The semiconductor industry is a rapidly developing industry, and the development of semiconductor integrated circuits follows Moore's law and develops rapidly. For the semiconductor industry, the precise grasp and control of the manufacturing cycle is the key to not being eliminated in the rapidly developing semiconductor industry. For a wafer fab, making a production plan in advance according to the size of the order, the capacity of the production line, and the production cycle is an indispensable link to complete production quickly and increase profits. [0003] At present, wafer production plants generally use guessing methods to formulate production plans. For example, according to the scheduling rules of p...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06Q10/04G06Q10/06
Inventor 许磊羌志良时灵灵尹俊彭婷婷
Owner SEMICON MFG INT (SHANGHAI) CORP
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